Dr. Swaraj Bandhu Mahato Profile

Dr. Swaraj Bandhu Mahato

Research Engineer at imec

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Publications (5)

Proceedings Article | 13 December 2020 Poster + Presentation + Paper

Optimization of a CCD-in-CMOS TDI detector's operating clock voltages by Taguchi based Grey relational analysis

Swaraj Bandhu Mahato, Pierre Boulenc

Proceedings Volume 11454, 1145430 (2020) https://doi.org/10.1117/12.2560356

KEYWORDS: Sensors, Clocks, CCD cameras, Charge-coupled devices, System on a chip, Image sensors, Satellite imaging, Satellites, Imaging systems, CMOS technology

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Proceedings Article | 16 July 2018 Paper

Two-dimensional MTF characterization of a large format CMOS detector

Swaraj Bandhu Mahato, Joris De Ridder, Guy Meynants, Gert Raskin, Hans Van Winckel

Proceedings Volume 10709, 107092X (2018) https://doi.org/10.1117/12.2313012

KEYWORDS: Modulation transfer functions, CMOS sensors, Sensors, Point spread functions, Image sensors, Imaging systems

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Proceedings Article | 16 July 2018 Paper

Characterization of the per-pixel dark current and activation energy of a large format CMOS image sensor

Swaraj Bandhu Mahato, Gert Raskin, Guy Meynants, Joris De Ridder, Hans Van Winckel

Proceedings Volume 10709, 107092W (2018) https://doi.org/10.1117/12.2312977

KEYWORDS: CMOS sensors, Sensors, Image sensors, Imaging systems, Astronomy, Photodiodes, Temperature sensors

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Proceedings Article | 9 May 2018 Paper

Kernel-based crosstalk quantification and analysis of a CMOS image sensor

Swaraj Bandhu Mahato, Joris De Ridder, Guy Meynants, Gert Raskin, Hans Van Winckel

Proceedings Volume 10680, 1068004 (2018) https://doi.org/10.1117/12.2306499

KEYWORDS: CMOS sensors, Image sensors, Point spread functions, Sensors, Optical filters, Microscopes, Raster graphics, Charge-coupled devices, Motion controllers, Imaging systems

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Proceedings Article | 27 July 2016 Paper

Noise optimization of the source follower of a CMOS pixel using BSIM3 noise model

Swaraj Mahato, Guy Meynants, Gert Raskin, J. De Ridder, H. Van Winckel

Proceedings Volume 9915, 99151P (2016) https://doi.org/10.1117/12.2231190

KEYWORDS: Optimization (mathematics), Field effect transistors, Capacitance, Optimization (mathematics), CMOS sensors, CMOS technology, Capacitors, Thermal modeling, Cadmium sulfide, Transistors, Device simulation

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