Sebastian Semper
at Technische Univ Ilmenau
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 May 2019 Presentation + Paper
Proceedings Volume 10990, 109900R (2019) https://doi.org/10.1117/12.2518594
KEYWORDS: Speckle pattern, Image quality, Image restoration, Wavelets, Compressed sensing, Signal to noise ratio

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