Prof. Salvatore Gerbino
at Univ degli Studi della Campania Luigi Vanvitelli
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 June 2019 Paper
Proceedings Volume 11059, 110590A (2019) https://doi.org/10.1117/12.2526075
KEYWORDS: Manufacturing, Laser welding, Optical testing, Control systems, Aluminum, Scanning electron microscopy, Data modeling, Data communications, Computed tomography

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