Mr. Ricardo A. Fiallo Profile

Ricardo A. Fiallo

at The Pennsylvania State Univ

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 4 October 2024 Presentation + Paper

Fabrication and optical characterization of doubly chiral sculptured thin film

Abdul Rehman, Ricardo Fiallo, Akhlesh Lakhtakia

Proceedings Volume 13116, 1311608 (2024) https://doi.org/10.1117/12.3027479

KEYWORDS: Tunable filters, Optical filters, Fabrication, Thin films, Reflectivity, Zinc selenide, Reflection, Polarized light, Physical vapor deposition, Spectrophotometry

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SPIE Journal Paper | 11 August 2023 Open Access

On temporally periodic physical vapor deposition on random rough surfaces (Erratum)

Ricardo A. Fiallo, Chengzhi Li, Akhlesh Lakhtakia, Mark W. Horn

JNP, Vol. 17, Issue 03, 039901, (August 2023) https://doi.org/10.1117/12.10.1117/1.JNP.17.039901

KEYWORDS: Physical vapor deposition, Metamaterials, Mechanics, Lithium, Engineering

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SPIE Journal Paper | 21 July 2023

On temporally periodic physical vapor deposition on random rough surfaces

Ricardo Fiallo, Chengzhi Li, Akhlesh Lakhtakia, Mark Horn

JNP, Vol. 17, Issue 03, 036005, (July 2023) https://doi.org/10.1117/12.10.1117/1.JNP.17.036005

KEYWORDS: Thin films, Glasses, Thin film deposition, Mirror surfaces, Mirrors, Physical vapor deposition, Reflectivity, Silicon, Semiconducting wafers, Contrast transfer function

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Proceedings Article | 25 April 2023 Paper

Alteration of optical Bragg phenomenon by substrate roughness

Ricardo Fiallo, Chengzhi Li, Mark Horn, Akhlesh Lakhtakia

Proceedings Volume 12490, 1249004 (2023) https://doi.org/10.1117/12.2659702

KEYWORDS: Glasses, Thin films, Silicon, Mirror surfaces, Thin film deposition, Contrast transfer function, Semiconducting wafers, Mirrors, Reflectivity, Film thickness

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Proceedings Article | 1 February 2023 Paper

Architecting the columnar morphology of sculptured thin films for polarization-universal bandgaps

Ricardo Fiallo, Mark Horn, Akhlesh Lakhtakia

Proceedings Volume 12477, 124770F (2023) https://doi.org/10.1117/12.2646145

KEYWORDS: Thin films, Scanning electron microscopy, Zinc, Transmittance, Silicon, Polarization, Physical vapor deposition, Photomicroscopy, Glasses, Chiral metamaterials

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Showing 5 of 6 publications

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