Mr. Gannavarapu Rajshekhar Profile

Gannavarapu Rajshekhar

at Indian Institute of Technology Kanpur

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Author

Publications (7)

Proceedings Article | 15 August 2023 Poster + Presentation + Paper

Nanoscale surface topography using low-cost digital holographic microscopy

Dhruvam Pandey, Subrahmanya K. N., Rajshekhar Gannavarapu

Proceedings Volume 12618, 126180Z (2023) https://doi.org/10.1117/12.2672530

KEYWORDS: Digital holography, Holograms, Microscopy, Holography, Cameras, Graphics processing units, Signal processing, Nondestructive evaluation

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Proceedings Article | 10 October 2020 Presentation + Paper

Investigation of temporally varying fringe pattern defects using machine learning for optical metrology

Aditya Madipadaga, Rajshekhar Gannavarpu

Proceedings Volume 11552, 115520L (2020) https://doi.org/10.1117/12.2584950

KEYWORDS: Fringe analysis, Machine learning, Optical metrology, Signal to noise ratio, Nondestructive evaluation, Image classification, Detection and tracking algorithms, Spatial frequencies, Interferometry, Interference (communication)

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Proceedings Article | 10 October 2020 Presentation + Paper

Dynamic fringe analysis using GPU assisted root-MUSIC method

Jagadesh Ramaiah, Rajshekhar Gannavarpu

Proceedings Volume 11552, 1155206 (2020) https://doi.org/10.1117/12.2584892

KEYWORDS: Fringe analysis, Stress analysis, Speckle pattern, Signal to noise ratio, Refractive index, Optical testing, Nondestructive evaluation, Interferometry, Holographic interferometry, Graphics processing units

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Proceedings Article | 10 October 2020 Poster + Presentation + Paper

Demodulation of fringe patterns corrupted by non uniform intensity variations in dynamics studies

Allaparthi Venkata Satya Vithin, Issac Show, Sreeprasad Ajithaprasad, Gannavarapu Rajshekhar

Proceedings Volume 11552, 115521Z (2020) https://doi.org/10.1117/12.2584987

KEYWORDS: Fringe analysis, Demodulation, Signal to noise ratio, Phase measurement, Interferometry, Reflectivity, Metrology, Interference (communication), Graphics processing units, Analytical research

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Proceedings Article | 1 April 2020 Paper

Fast fringe analysis method using graphics processing unit acceleration for dynamic fault identification

Ankur Vishnoi, Rajshekhar Gannavarpu

Proceedings Volume 11352, 113520J (2020) https://doi.org/10.1117/12.2555301

KEYWORDS: Fringe analysis, Graphics processing units, Parallel processing, Spatial frequencies, Nondestructive evaluation, Inspection, Visualization, Binary data, Computer programming, Optical metrology

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Proceedings Article | 16 October 2019 Paper

A GPU assisted space frequency method for dynamic defect detection in optical metrology

Sreeprasad Ajithaprasad, Vigneshwar Rajendran, Rajshekhar Gannavarpu

Proceedings Volume 11205, 1120526 (2019) https://doi.org/10.1117/12.2541658

KEYWORDS: Fringe analysis, Defect detection, Interferometry, Fourier transforms, Optical metrology, Diffraction, Image processing

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Proceedings Article | 27 April 2016 Open Access

Phase correlation imaging (PCI) for cell dynamics investigation (Conference Presentation)

Lihong Ma, Rajshekhar Gannavarpu, Ru Wang, Basanta Bhaduri, Shamira Sridharan, Mustafa Mir, Arindam Chakraborty, Supriya Prasanth, Larry Millet, Martha Gillette, Gabriel Popescu

Proceedings Volume 9718, 97180P (2016) https://doi.org/10.1117/12.2217666

KEYWORDS: Microscopy, Phase measurement, Phase imaging, Refractive index, Image processing, Ruthenium, Current controlled current source

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Showing 5 of 7 publications

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