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Naofumi Suzuki
at NEC Corp
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Author
Publications (1)
Proceedings Article | 7 February 2009 Paper
Highly reliable high speed 1.1um-InGaAs/GaAsP-VCSELs
H. Hatakeyama, T. Anan, T. Akagawa, K. Fukatsu, N. Suzuki, K. Tokutome, M. Tsuji
Proceedings Volume 7229, 722902 (2009) https://doi.org/10.1117/12.808717
KEYWORDS: Vertical cavity surface emitting lasers, Reliability, Failure analysis, Accelerated life testing, Quantum wells, Modulation, Indium gallium arsenide, Oxides, Electroluminescence, Optical interconnects
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