Dr. Monica S. Sawicki Profile

Dr. Monica S. Sawicki

at Southern Connecticut State Univ

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 20 January 2009 Paper

Computer assisted analysis of microscopy images

M. Sawicki, P. Munhutu, J. DaPonte, C. Caragianis-Broadbridge, A. Lehman, T. Sadowski, E. Garcia, C. Heyden, L. Mirabelle, P. Benjamin

Proceedings Volume 7243, 724305 (2009) https://doi.org/10.1117/12.805613

KEYWORDS: Particles, Image processing, Transmission electron microscopy, Nanoparticles, Image analysis, Optical spheres, Latex, Statistical analysis, Image processing algorithms and systems, Microscopy

Read Abstract +

Proceedings Article | 10 October 2007 Paper

Characterization of nanoparticles by computer imaging particle analysis

J. DaPonte, T. Sadowski, C. Broadbridge, P. Munhutu, A. Lehman, D. Krishnamoorthy, E. Garcia, M. Sawicki, C. Heyden, L. Mirabelle, P. Benjamin

Proceedings Volume 6768, 676807 (2007) https://doi.org/10.1117/12.734966

KEYWORDS: Particles, Transmission electron microscopy, Nanoparticles, Calibration, Latex, Optical spheres, Atomic force microscopy, Binary data, Statistical analysis, Image filtering

Read Abstract +

Proceedings Article | 25 April 2007 Paper

Comparison of thresholding techniques on nanoparticle images

J. DaPonte, T. Sadowski, C. Broadbridge, D. Day, A. Lehman, D. Krishna, L. Marinella, P. Munhutu, M. Sawicki

Proceedings Volume 6575, 65750L (2007) https://doi.org/10.1117/12.714998

KEYWORDS: Particles, Transmission electron microscopy, Atomic force microscopy, Binary data, Nanoparticles, Latex, Optical spheres, Image segmentation, Image processing algorithms and systems, Quantitative analysis

Read Abstract +

Proceedings Article | 25 April 2007 Paper

Application of particle analysis to transmission electron microscopy (TEM)

J. DaPonte, T. Sadowski, C. Broadbridge, D. Day, A. Lehman, D. Krishna, L. Marinella, P. Munhutu, M. Sawicki

Proceedings Volume 6575, 65750H (2007) https://doi.org/10.1117/12.714749

KEYWORDS: Particles, Transmission electron microscopy, Nanoparticles, Binary data, Image filtering, Polymers, Electrons, Image processing, Nanotechnology, Image enhancement

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years