Over the past two decades, laser beam melting has emerged as the leading metal additive manufacturing process to produce small and medium-sized structures. Due to the complex physical phenomena involved in the laser- material interaction, instabilities in the melt pool morphology affect the final quality of the structure and remain difficult to predict by simulation. Several monitoring approaches, based on the radiation of the melt process or on a secondary illumination source, have been developed to measure its length, width and height. Nevertheless, the final morphology of the part is influenced by the volumetric forces as well as by the capillary forces applied to the melt. Thus, the shape of the melt surface is of primary interest to control the stability of the melt. Due to its intrinsic heterogeneity, its motion on the powder bed and its own dynamics, the measurement of the melt pool surface shape requires a full-field ”one-shot” acquisition with a short exposure time of a few microseconds. In this paper, we propose multi-wavelength digital holography for the in-situ investigation of the melt pool.
Multi-wavelength digital holography is a very powerful approach for surface shape measurements. It has the advantage of being contact-less, non-intrusive, and yields full-field surface shape data without any requirement for scanning. When dealing with off-axis digital holography and spatial multiplexing of two-wavelength digital holograms, the method becomes real-time, in the sense that the surface shape can be measured at each time instant at which the holograms are recorded. Thus, phase shifting and sequential recording are suppressed. However, due to the roughness of the inspected surface, speckle decorrelation occurs and noise is included in the final data. The noise amount in the data must be investigated in order to define the best processing approach for holograms. This paper proposes the analysis of the standard deviation of noise in surface-shape data from two-wavelength spatially-multiplexed digital holograms. The influence of noise on the measurements of the surface shape is described by an analytical approach. Relationships to quantify the minimum measurable surface height is given by taking into account the experimental parameters of the set-up. These parameters are related to the spatial bandwidths, modulation of holograms, saturation ratio, number of electrons in pixels, readout noise, quantization noise, photon noise, and speckle decorrelation due to roughness. The theoretical modeling is discussed and analysis when considering practical situation for industrial surface shape measurements.
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