Kenneth J. Moy
Principal Scientist at National Security Technologies LLC
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 5 September 2008 Paper
Ken Moy, Ming Wu, Craig Kruschwitz, Aric Tibbitts, Matt Griffin, Greg Rochau
Proceedings Volume 7079, 70791B (2008) https://doi.org/10.1117/12.795720
KEYWORDS: Microchannel plates, Imaging systems, Sensors, Pulsed laser operation, X-rays, X-ray imaging, Ultraviolet radiation, Cameras, X-ray characterization, X-ray detectors

Proceedings Article | 11 September 2006 Paper
Kenneth Moy, Michael Cuneo, Ian McKenna, Thomas Keenan, Thomas Sanford, Ray Mock
Proceedings Volume 6319, 63190I (2006) https://doi.org/10.1117/12.681954
KEYWORDS: Sensors, Spectroscopy, X-rays, Silicon, Collimation, Hard x-rays, Tungsten, PIN photodiodes, Physics, Photons

Proceedings Article | 19 July 1996 Paper
James Tinsley, Kenneth Moy, Laura Tunnell
Proceedings Volume 2859, (1996) https://doi.org/10.1117/12.245121
KEYWORDS: Sensors, Cobalt, Gamma radiation, Explosives, Scintillators, Photomultipliers, Particles, Lead, Electronics, Safety

Proceedings Article | 22 December 1992 Paper
Kenneth Moy, Ching Wang, John Flatley, Michael Pocha, Brent Davis, Ronald Wagner
Proceedings Volume 1734, (1992) https://doi.org/10.1117/12.138584
KEYWORDS: Sensors, Gallium arsenide, Diodes, Gamma radiation, Electrodes, Silicon, Signal detection, Oscilloscopes, Spectroscopy, Plasma

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