Dr. Jörg Ackermann Profile

Dr. Jörg Ackermann

at FluIT Biosystems GmbH

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 21 February 2008 Paper

Single molecule detection for in vitro diagnostics

Thomas Kirner, Jörg Ackermann, Harald Mathis, Benjamin Greiner, Thomas Tonn, David Tschachojan, Natasa Kukoc-Zivojnov, Sebastian Giehring

Proceedings Volume 6862, 68620H (2008) https://doi.org/10.1117/12.763637

KEYWORDS: Molecules, Fluorescence correlation spectroscopy, Glasses, Luminescence, In vitro testing, Confocal microscopy, Biological research, Fluorescence spectroscopy, Diagnostics, Stochastic processes

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Proceedings Article | 21 February 2008 Paper

Single molecules in fluorescence fluctuation spectroscopy: effective volume and photon counting histogram

Jörg Ackermann, Harald Mathis, Benjamin Greiner

Proceedings Volume 6862, 686204 (2008) https://doi.org/10.1117/12.763904

KEYWORDS: Molecules, Photon counting, Probability theory, Luminescence, Particles, Stochastic processes, Fluorescence correlation spectroscopy, Diffusion, Fluorescence spectroscopy, Spectroscopy

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Proceedings Article | 13 September 1996 Paper

Digital standard cells and operational amplifiers for operation up to 250 degrees C using low-cost CMOS technology

Jens Stemmer, Joerg Ackermann, Dirk Uffmann, Jochen Aderhold

Proceedings Volume 2875, (1996) https://doi.org/10.1117/12.250892

KEYWORDS: Amplifiers, Temperature metrology, Transistors, CMOS technology, Standards development, Electronics, Analog electronics, Switching, Digital electronics, Diffusion

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Proceedings Article | 13 September 1996 Paper

Snap-back temperature dependence for an Epi-CMOS ASIC-process up to 250 degrees C

Dirk Uffmann, Christina Ibrom, Joerg Ackermann, Jens Stemmer, Jochen Aderhold

Proceedings Volume 2875, (1996) https://doi.org/10.1117/12.250891

KEYWORDS: Transistors, Vestigial sideband modulation, Doping, Temperature metrology, Electronics, Molybdenum, Measurement devices, Oxides, Power supplies, Finite element methods

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Proceedings Article | 15 September 1995 Paper

Latch-up temperature dependence of majority carrier guard structures up to 250-degrees C

Dirk Uffmann, Jens Stemmer, Hans-Ulrich Schroeder, Joerg Ackermann, Jochen Aderhold

Proceedings Volume 2636, (1995) https://doi.org/10.1117/12.221140

KEYWORDS: Temperature metrology, Resistance, Doping, Measurement devices, Electrodes, Device simulation, Electronics, Transistors, Silicon, Environmental sensing

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