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Jia Liu
at Tsinghua Univ
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Publications (1)
Proceedings Article | 19 November 2008 Paper
Analysis of reliability for multi-ring interconnection of RPR networks
Jia Liu, Depeng Jin, Lieguang Zeng, Yong Li
Proceedings Volume 7137, 71371C (2008) https://doi.org/10.1117/12.804324
KEYWORDS: Reliability, Failure analysis, Nickel, Network architectures, Standards development, Lithium, Microwave radiation, Data communications, Information science, Information technology
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