Dr. Jaroslav Cihelka
at Institute of Physics of the ASCR vvi
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 19 May 2011 Paper
M. De Grazia, H. Merdji, T. Auguste, B. Carré, J. Gaudin, G. Geoffroy, S. Guizard, F. Krejci, J. Kuba, J. Chalupsky, J. Cihelka, V. Hajkova, M. Ledinský, L. Juha
Proceedings Volume 8077, 80770L (2011) https://doi.org/10.1117/12.890093
KEYWORDS: Extreme ultraviolet, Polymethylmethacrylate, Absorption, Molecules, Polymers, Free electron lasers, Heat treatments, Ultrafast phenomena, Chemical species, Solids

Proceedings Article | 29 September 2009 Paper
R. Lee, B. Nagler, U. Zastrau, R. Fäustlin, S. Vinko, T. Whitcher, R. Sobierajski, J. Krzywinski, L. Juha, A. Nelson, S. Bajt, K. Budil, R. Cauble, T. Bornath, T. Burian, J. Chalupsky, H. Chapman, J. Cihelka, T. Döppner, T. Dzelzainis, S. Düsterer, M. Fajardo, E. Förster, C. Fortmann, S. Glenzer, S. Göde, G. Gregori, V. Hajkova, P. Heimann, M. Jurek, F. Khattak, A. Khorsand, D. Klinger, M. Kozlova, T. Laarmann, H.-J. Lee, K.-H. Meiwes-Broer, P. Mercere, W. Murphy, A. Przystawik, R. Redmer, H. Reinholz, D. Riley, G. Röpke, K. Saksl, R. Thiele, J. Tiggesbäumker, S. Toleikis, T. Tschentscher, I. Uschmann, R. Falcone, R. Shepherd, J. Hastings, W. White, J. Wark
Proceedings Volume 7451, 74510E (2009) https://doi.org/10.1117/12.825349
KEYWORDS: Free electron lasers, X-rays, Extreme ultraviolet, Electrons, Absorption, Luminescence, Liquid crystal lasers, Photons, Fusion energy, Chemical species

Proceedings Article | 18 May 2009 Paper
R. Sobierajski, D. Klinger, M. Jurek, J. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hakova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. Hau-Reige, R. London
Proceedings Volume 7361, 736107 (2009) https://doi.org/10.1117/12.822152
KEYWORDS: Extreme ultraviolet, Silicon, Atomic force microscopy, Free electron lasers, Laser damage threshold, Optical microscopy, Sensors, Femtosecond phenomena, Absorption, Crystals

Proceedings Article | 18 May 2009 Paper
J. Chalupský, L. Juha, V. Hájková, J. Cihelka, L. Vysin, J. Gautier, J. Hajdu, S. Hau-Riege, M. Jurek, J. Krzywinski, Ri. London, E. Papalazarou, J. Pelka, G. Rey, S. Sebban, R. Sobierajski, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, C. Valentin, H. Wabnitz, P. Zeitoun
Proceedings Volume 7361, 736108 (2009) https://doi.org/10.1117/12.822297
KEYWORDS: Polymethylmethacrylate, Laser ablation, X-rays, Solids, Atomic force microscopy, X-ray lasers, Chemical species, Signal attenuation, Gaussian beams, Surface roughness

Proceedings Article | 18 May 2009 Paper
J. Cihelka, L. Juha, J. Chalupský, F. Rosmej, O. Renner, K. Saksl, V. Hájková, L. Vyšin, E. Galtier, R. Schott, A. Khorsand, D. Riley, T. Dzelzainis, A. Nelson, R. Lee, P. Heimann, B. Nagler, S. Vinko, J. Wark, T. Whitcher, S. Toleikis, T. Tschentscher, R. Faustlin, H. Wabnitz, S. Bajt, H. Chapman, J. Krzywinski, R. Sobierajski, D. Klinger, M. Jurek, J. Pelka, S. Hau-Riege, R. London, J. Kuba, N. Stojanovic, K. Sokolowski-Tinten, A. Gleeson, M. Störmer, J. Andreasson, J. Hajdu, N. Timneanu
Proceedings Volume 7361, 73610P (2009) https://doi.org/10.1117/12.822766
KEYWORDS: Aluminum, Plasma, Silicon, Ions, Free electron lasers, Copper, Chemical species, Spectroscopy, Mirrors, Emission spectroscopy

Showing 5 of 9 publications
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