Dr. Jangwoo Kim Profile

Dr. Jangwoo Kim

Senior Scientist at Pohang Accelerator Lab

SPIE Involvement:

Conference Program Committee | Author

Publications (4)

Proceedings Article | 12 May 2015 Paper

Damage to inorganic materials illuminated by focused beam of x-ray free-electron laser radiation

Takahisa Koyama, Hirokatsu Yumoto, Kensuke Tono, Tadashi Togashi, Yuichi Inubushi, Tetsuo Katayama, Jangwoo Kim, Satoshi Matsuyama, Makina Yabashi, Kazuto Yamauchi, Haruhiko Ohashi

Proceedings Volume 9511, 951107 (2015) https://doi.org/10.1117/12.2182778

KEYWORDS: Silicon, X-rays, Silica, Mirrors, Grazing incidence, Coating, Reflectivity, Free electron lasers, X-ray lasers, Metals

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Proceedings Article | 27 September 2013 Paper

Damage characteristics of platinum/carbon multilayers under x-ray free-electron laser irradiation

Jangwoo Kim, Takahisa Koyama, Hirokatsu Yumoto, Ayaka Nagahira, Satoshi Matsuyama, Yasuhisa Sano, Makina Yabashi, Haruhiko Ohashi, Tetsuya Ishikawa, Kazuto Yamauchi

Proceedings Volume 8848, 88480S (2013) https://doi.org/10.1117/12.2022735

KEYWORDS: Multilayers, X-rays, Reflectivity, Platinum, Grazing incidence, Free electron lasers, Transmission electron microscopy, X-ray optics, Carbon, X-ray lasers

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Proceedings Article | 27 September 2013 Paper

Damage threshold investigation using grazing incidence irradiation by hard x-ray free electron laser

T. Koyama, H. Yumoto, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi

Proceedings Volume 8848, 88480T (2013) https://doi.org/10.1117/12.2025377

KEYWORDS: Reflectivity, X-rays, Mirrors, Laser damage threshold, Free electron lasers, Hard x-rays, Coating, Grazing incidence, Rhodium, X-ray optics

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Proceedings Article | 28 September 2011 Paper

Development of a one-dimensional Wolter mirror for achromatic full-field x-ray microscopy

S. Matsuyama, N. Kidani, H. Mimura, J. Kim, Y. Sano, K. Tamasaku, Y. Kohmura, M. Yabashi, T. Ishikawa, K. Yamauchi

Proceedings Volume 8139, 813905 (2011) https://doi.org/10.1117/12.892987

KEYWORDS: Mirrors, X-rays, X-ray microscopy, Microscopes, Spatial resolution, Point spread functions, X-ray imaging, Imaging systems, X-ray optics, Microscopy

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Conference Committee Involvement (4)

Advances in Metrology for X-Ray and EUV Optics XI

3 August 2025 | San Diego, California, United States

Advances in X-Ray/EUV Sources, Optics, and Components XX

3 August 2025 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XIX

19 August 2024 | San Diego, California, United States

Advances in Metrology for X-Ray and EUV Optics X

23 August 2023 | San Diego, California, United States

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