Dr. In-Tae Bae Profile

Dr. In-Tae Bae

at The Aerospace Corp

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Author

Publications (4)

Proceedings Article | 13 March 2024 Paper

Reliability and failure mode analysis of high-speed 850-nm multi-mode and 795-nm single-mode VCSELs for space applications

Yongkun Sin, Jesse Theiss, Michael Huang, Emily Tang, Jeffrey Childs, In-Tae Bae, Adam Bushmaker

Proceedings Volume 12904, 129040D (2024) https://doi.org/10.1117/12.3000490

KEYWORDS: Vertical cavity surface emitting lasers, Reliability, Failure analysis, Accelerated life testing, Quantum wells, Photocurrent, Indium gallium arsenide

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Proceedings Article | 12 March 2024 Paper

Time-resolved analysis of degradation in high-power broad-area lasers with quantum well and quantum dot active regions

Yongkun Sin, Cassidy Feltenberger, Dicky Daniel, Matthew Voegtle, In-Tae Bae

Proceedings Volume 12867, 128670I (2024) https://doi.org/10.1117/12.3000500

KEYWORDS: Electroluminescence, Quantum wells, Accelerated life testing, Quantum dots, High power lasers

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Proceedings Article | 15 March 2023 Paper

Reliability and failure mode analysis of high-speed 850nm oxide-confined multi-mode VCSELs for space applications

Yongkun Sin, Jesse Theiss, Michael Huang, Jeffrey Childs, In-Tae Bae, Zachary Lingley

Proceedings Volume 12439, 124390D (2023) https://doi.org/10.1117/12.2647286

KEYWORDS: Vertical cavity surface emitting lasers, Failure analysis, Reliability, Transmission electron microscopy, Quantum wells, Indium gallium arsenide, Accelerated life testing, Satellites

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Proceedings Article | 14 March 2023 Paper

Degradation in high-power broad-area lasers with quantum well and quantum dot active regions: a comparative study

Yongkun Sin, In-Tae Bae, Zachary Lingley

Proceedings Volume 12403, 124030C (2023) https://doi.org/10.1117/12.2647287

KEYWORDS: Transmission electron microscopy, Electroluminescence, Quantum wells, Quantum processes, Quantum dots, High power lasers, Quantum confinement

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