Dr. Herbert Legall Profile

Dr. Herbert Legall

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 4 March 2019 Paper

X-ray emission during ultrashort pulse laser processing

Herbert Legall, Christoph Schwanke, Jörn Bonse, Jörg Krüger

Proceedings Volume 10908, 1090802 (2019) https://doi.org/10.1117/12.2516165

KEYWORDS: Ionization, Laser systems engineering, X-ray detectors, Sensors

Read Abstract +

Proceedings Article | 30 September 2013 Paper

Prospects of ultrafast x-ray absorption investigations using laboratory based sources

Holger Stiel, Matthias Schnürer, Herbert Legall, Wolfgang Malzer, Lars Anklamm, Christopher Schlesiger, Karol Janulewicz, Mazhar Iqbal, Peter Nickles

Proceedings Volume 8849, 88490H (2013) https://doi.org/10.1117/12.2023906

KEYWORDS: X-rays, Crystals, X-ray sources, Absorption, Spectroscopy, Ultrafast phenomena, Pulsed laser operation, Plasma, Sensors, Electrons

Read Abstract +

Proceedings Article | 11 December 2012 Paper

Laboratory full-field transmission x-ray microscopy

Christian Seim, Jonas Baumann, Herbert Legall, Christoph Redlich, Ioanna Mantouvalou, G. Blobel, Holger Stiel, Birgit Kanngießer

Proceedings Volume 8678, 867808 (2012) https://doi.org/10.1117/12.2011142

KEYWORDS: X-ray microscopy, X-rays, Microscopes, Plasma, Nitrogen, Tomography, Zone plates, Liquids, Synchrotrons, Spatial resolution

Read Abstract +

Proceedings Article | 12 September 2005 Paper

Elements of capillary optics applied in the spectral range between 10 and 15 nm

J. Tümmler, H. Stiel, H. Legall, R. Bruch, A. Bjeoumikhov, N. Langhoff, K. Janulewicz, G. Priebe, P. Nickles

Proceedings Volume 5919, 59190F (2005) https://doi.org/10.1117/12.617053

KEYWORDS: Beam splitters, Capillaries, Extreme ultraviolet, Optical components, Reflectivity, Plasma, Glasses, Charge-coupled devices, X-ray lasers, Zone plates

Read Abstract +

Proceedings Article | 31 August 2005 Paper

Applications of highly oriented pyrolytic graphite (HOPG) for x-ray diagnostics and spectroscopy

Herbert Legall, Holger Stiel, Peter-Victor Nickles, Aniouar Bjeoumikhov, Norbert Langhoff, Michael Haschke, Vladimir Arkadiev, Reiner Wedell

Proceedings Volume 5918, 591802 (2005) https://doi.org/10.1117/12.614847

KEYWORDS: Crystals, X-rays, Spectrometers, Charge-coupled devices, Spectral resolution, Reflectivity, Sensors, Reflection, Copper, Absorption

Read Abstract +

Proceedings Article | 16 June 2003 Paper

Characterization of a laser-produced plasma source for a laboratory EUV reflectometer

Frank Scholze, Frank Scholz, Johannes Tuemmler, Gerhard Ulm, Herbert Legall, Peter-Viktor Nickles, Wolfgang Sandner, Holger Stiel, Ludwig van Loyen

Proceedings Volume 5037, (2003) https://doi.org/10.1117/12.482646

KEYWORDS: Extreme ultraviolet, Plasma, Spectroscopy, Mirrors, Pulsed laser operation, Reflectometry, Laser energy, Charge-coupled devices, Calibration, Power meters

Read Abstract +

With the development of EUV lithography there is an increasing need for high-accuracy at-wavelength metrology. In particular, there is an urgent need for metrology at optical components like mirrors or masks close to the production line. Sources for metrology have to fit different demands on EUV power and spectral shape than sources for steppers systems. We present the results of the radiometric characterization of a laser produced plasma (LPP)-source, newly developed at Max-Born-Institute Berlin for use in an EUV reflectometer. It is operated with a high-power pointing-stabilized laser beam (energy per pulse up to 700 mJ, 10 ns pulse duration, < ± 25 μrad pointing stability) at 532 nm which is focussed on a rotating Au target cylinder. The incident angle of the laser beam is set to 63°, the detecting angle 55° to the target normal. The source has been characterized regarding spectral photon flux, source size and source point stability. Two independently calibrated instruments, an imaging spectrometer and a double multilayer tool for in-band power measurements were used to obtain highly reliable quantitative values for the EUV emission of the Au-LPP source. Both instruments were calibrated by Physikalisch-Technische Bundesanstalt in its radiometry laboratory at the electron storage ring BESSY II. We obtained a source size of 30 μm by 50 μm (2s horizontal by vertical) and a stability of better than 2s=5 μm horizontally and 2s=9 μm vertically. A spectral photon flux of 1*10e14 /(s sr 0.1 nm) at 13.4 nm at a laser pulse energy of 630 mJ is obtained. The shot-to-shot stability of the source is about 5% (1s) for laser pulse energies above 200 mJ. For pulse energies between 200 mJ and 700 mJ, there is a linear relation between laser pulse energy and EUV output. The spectrum shows a flat continuos emission in the EUV spectral range, which is important for wavelength scanning reflectometry. High stability in total flux and spectral shape of the plasma emission as well as low debris was only obtained using a new target position for each shot. There is also a trade off between source size and EUV power. For a slightly defocused laser, an increase in EUV power up to a factor of two is obtained, while the source size also increases by about a factor of two. It is shown that an Au-LPP source provides spectrally flat reproducible emission with sufficient power at low debris conditions for the operation of a laboratory based EUV reflectometer.

Proceedings Article | 2 June 2003 Paper

New laboratory EUV reflectometer for large optics using a laser plasma source

Ludwig van Loyen, Thomas Boettger, Stefan Braun, Hermann Mai, Andreas Leson, Frank Scholze, Johannes Tuemmler, Gerhard Ulm, Herbert Legall, Peter Nickles, Wolfgang Sandner, Holger Stiel, Christian Rempel, Mirko Schulze, Joerg Brutscher, Fritz Macco, Stefan Muellender

Proceedings Volume 5038, (2003) https://doi.org/10.1117/12.485042

KEYWORDS: Extreme ultraviolet, Reflectivity, Sensors, Reflectometry, Beam splitters, Monochromators, EUV optics, Mirrors, Pulsed laser operation, Signal detection

Read Abstract +

Showing 5 of 7 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years