Heba Sharaf
Software Development Engineer at Siemens EDA
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 November 2012 Paper
Proceedings Volume 8522, 852222 (2012) https://doi.org/10.1117/12.964381
KEYWORDS: Double patterning technology, Photomasks, Lithography, Standards development, Visualization, Prototyping, Digital electronics, Feature extraction, Photomask technology, Current controlled current source

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