Prof. Sen Han
at Univ of Shanghai for Science and Technology
SPIE Involvement:
Conference Program Committee | Conference Chair | Editor | Author | Student Chapter Advisor
Publications (60)

Proceedings Article | 27 November 2023 Poster + Paper
Proceedings Volume 12769, 1276916 (2023) https://doi.org/10.1117/12.2686758
KEYWORDS: Error analysis, Spherical lenses, Fizeau interferometers, Equipment, Optical metrology, Optical interferometry, Inspection, Confocal microscopy, Zemax, Optical surfaces

Proceedings Article | 27 November 2023 Poster + Paper
Proceedings Volume 12769, 1276917 (2023) https://doi.org/10.1117/12.2686780
KEYWORDS: Phase unwrapping, Interferometry, Parallel computing, Optical testing, Mathematical optimization, Computer hardware

Proceedings Article | 27 November 2023 Paper
Proceedings Volume 12769, 127690H (2023) https://doi.org/10.1117/12.2687259
KEYWORDS: Fizeau interferometers, Phase shifts, Optical testing, Astronomical interferometers, Optics manufacturing, Optical surfaces, Laser development, Astronomical imaging, Tolerancing, Spectral density

Proceedings Article | 27 November 2023 Paper
Proceedings Volume 12769, 127690N (2023) https://doi.org/10.1117/12.2686769
KEYWORDS: Semiconducting wafers, Vibration, Environmental sensing, Turbulence, Wafer inspection, Laboratories, Thermal stability, Interferometry

Proceedings Article | 27 November 2023 Poster + Paper
Proceedings Volume 12769, 127691K (2023) https://doi.org/10.1117/12.2686955
KEYWORDS: Confocal microscopy, Objectives, Chromatic aberrations, Light sources, Sensors, Lenses, Design and modelling, Imaging spectroscopy, Simulations, Monochromatic aberrations

Showing 5 of 60 publications
Proceedings Volume Editor (17)

Showing 5 of 17 publications
Conference Committee Involvement (74)
Current Developments in Lens Design and Optical Engineering XXVI
3 August 2025 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection XIV
23 June 2025 | Munich, Germany
Optical Technology and Measurement for Industrial Applications Conference
21 April 2025 | Yokohama, Japan
Optical Design and Testing XIV
13 October 2024 | Nantong, Jiangsu, China
Optical Metrology and Inspection for Industrial Applications XI
12 October 2024 | Nantong, Jiangsu, China
Showing 5 of 74 Conference Committees
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