Haihua An
at Sichuan Univ
SPIE Involvement:
Author
Area of Expertise:
Optical measurement , Phase retrieval , Image processing , Fringe projection , 3-D reconstruction , Filtering
Profile Summary

Haihua An received the B.E. degree in electronic information science and technology from Southwest Jiaotong University, Chengdu, China, in 2019. He is currently pursuing the Ph.D. degree in optical engineering with the Sichuan University, Chengdu, China, in 2019.09-2024.06. He is a reviewer of Expert Syst. Appl., Opt. Express, Opt. Lett., Measurement, Opt. Lasers Eng., Appl. Opt., Opt. Eng.,Sci. Rep.
His research interests include fringe projection profilometry (FPP), pattern recognition, image processing, etc.
Publications (6)

SPIE Journal Paper | 28 January 2023
OE, Vol. 62, Issue 01, 014107, (January 2023) https://doi.org/10.1117/12.10.1117/1.OE.62.1.014107
KEYWORDS: Phase shifts, Phase retrieval, Phase unwrapping, Discontinuities, Tunable filters, Optical engineering, Digital filtering, Error analysis, Cameras, Projection systems

Proceedings Article | 15 December 2022 Paper
Proceedings Volume 12478, 1247815 (2022) https://doi.org/10.1117/12.2652179
KEYWORDS: Phase shifts, Phase retrieval, Fringe analysis, 3D image reconstruction

SPIE Journal Paper | 14 April 2022
Na Yang, Yiping Cao, Haihua An, Zidong Han, Haitao Wu
OE, Vol. 61, Issue 04, 044105, (April 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.4.044105
KEYWORDS: Phase shifts, 3D metrology, Phase measurement, Modulation, Video, Fringe analysis, Optical engineering, Data processing, Optical filters, Reflectivity

SPIE Journal Paper | 11 April 2022
Cai Xu, Yiping Cao, Haitao Wu, Hongmei Li, Hechen Zhang, Haihua An
OE, Vol. 61, Issue 04, 044103, (April 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.4.044103
KEYWORDS: Phase shift keying, Diamond, Diffusion, Optical engineering, Modulation, 3D metrology, Curtains, Video, Phase shifts, Video processing

SPIE Journal Paper | 1 July 2021
Haitao Wu, Yiping Cao, Haihua An, Yang Li, Hongmei Li, Cai Xu
OE, Vol. 60, Issue 07, 074101, (July 2021) https://doi.org/10.1117/12.10.1117/1.OE.60.7.074101
KEYWORDS: 3D metrology, Modulation, Frequency modulation, Fermium, 3D modeling, Optical engineering, Reconstruction algorithms, Phase shifts, Phase shift keying, Fringe analysis

Showing 5 of 6 publications
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