Mr. Esmaeil Heidari Profile

Esmaeil Heidari

Lead Optical Systems Engineeri

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 28 August 2016 Presentation + Paper

Moire interferometry patterns for rotational alignment of structures

Esmaeil Heidari, Kevin Harding

Proceedings Volume 9960, 99600J (2016) https://doi.org/10.1117/12.2237032

KEYWORDS: Moire patterns, Optical alignment, Deflectometry, Solar cells, Manufacturing, Visualization, Fringe analysis, Cameras, 3D metrology, Neodymium

Read Abstract +

Proceedings Article | 20 September 2013 Paper

Automated cylindrical mapper using chromatic confocal measurement

Esmaeil Heidari, Kevin Harding, Robert Tait

Proceedings Volume 8839, 88390F (2013) https://doi.org/10.1117/12.2023760

KEYWORDS: Confocal microscopy, Surface finishing, Radium, Colorimetry, Sensors, Surface roughness, Imaging systems, Edge roughness, Metrology, Motion measurement

Read Abstract +

Proceedings Article | 19 February 2013 Paper

A single lens with no moving parts for rapid high-resolution 3D image capture

Dan Gray, Hongquiang Chen, Joseph Czechowski, Kang Zhang, Jilin Tu, Frederick Wheeler, Masako Yamada, Juan Pablo Cilia, Russell DeMuth, Esmaeil Heidari, Gil Abramovich, Kevin Harding

Proceedings Volume 8659, 86590N (2013) https://doi.org/10.1117/12.2001449

KEYWORDS: 3D image processing, Imaging systems, Cameras, Lens design, Modulation transfer functions, Image resolution, 3D image reconstruction, 3D metrology, 3D modeling, Structured light

Read Abstract +

Proceedings Article | 20 November 2012 Paper

Industrial surface finish method comparison for fine finish measurements

Kevin Harding, Esmaeil Heidari, Robert Tait, Guangping Xie, Zirong Zhai

Proceedings Volume 8563, 85630R (2012) https://doi.org/10.1117/12.2000179

KEYWORDS: Confocal microscopy, Surface finishing, Laser scattering, Manufacturing, Imaging systems, Calibration, Colorimetry, Surface roughness, Light scattering, Optical interferometry

Read Abstract +

Proceedings Article | 14 September 2011 Paper

Automated 3D IR defect mapping system for CZT wafer and tile inspection and characterization

Yi Liao, Esmaeil Heidari, Gil Abramovich, Christopher Nafis, Amer Butt, Joseph Czechowski, Kevin Harding, J. Eric Tkaczyk

Proceedings Volume 8133, 81330P (2011) https://doi.org/10.1117/12.892765

KEYWORDS: Semiconducting wafers, Infrared imaging, Inspection, Sensors, Associative arrays, Wafer inspection, 3D image processing, Neodymium, Crystals, Ions

Read Abstract +

Proceedings Article | 18 February 2011 Paper

Neuro-endovascular optical coherence tomography imaging: clinical feasibility and applications

Marlon Mathews, Jianping Su, Esmaeil Heidari, Mark Linskey, Zhongping Chen

Proceedings Volume 7883, 788341 (2011) https://doi.org/10.1117/12.876236

KEYWORDS: Optical coherence tomography, Arteries, Coherence imaging, In vivo imaging, Image segmentation, Pathology, Tissue optics, Optical imaging, Visualization, Image resolution

Read Abstract +

Showing 5 of 6 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years