Dr. Eitan Shalom
Lithography Group Leader at Tower Semiconductor Ltd
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 15 April 2008 Paper
Eitan Shalom, Shaike Zeid
Proceedings Volume 6923, 69233W (2008) https://doi.org/10.1117/12.772558
KEYWORDS: Semiconducting wafers, Photoresist processing, Standards development, Interfaces, Inspection, Head-mounted displays, Optical proximity correction, Scanning electron microscopy, Semiconductors, Chemically amplified resists

Proceedings Article | 13 August 1993 Paper
Proceedings Volume 1972, (1993) https://doi.org/10.1117/12.151102
KEYWORDS: Photoresist processing, Critical dimension metrology, Reflectivity, Absorption, Scanning electron microscopy, Image processing, Skin, Optical engineering, Diffusion, Lithography

Proceedings Article | 1 June 1990 Paper
Eitan Shalom, Donald Johnson, Kelly Hale, Terry Pebbles, William Curtis
Proceedings Volume 1262, (1990) https://doi.org/10.1117/12.20115
KEYWORDS: Photoresist developing, Absorption, Photoresist materials, Image processing, Picture Archiving and Communication System, Reflectivity, Process control, Dysprosium, Cadmium, Remote sensing

Proceedings Article | 1 June 1990 Paper
Donald Johnson, Eitan Shalom, Glenn Dickey, Kelly Hale, Terry Pebbles
Proceedings Volume 1262, (1990) https://doi.org/10.1117/12.20125
KEYWORDS: Photoresist materials, Picture Archiving and Communication System, Absorption, Photoresist developing, Etching, Plasma etching, Resistance, Plasma, Polymers, Optical imaging

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