Dominik Täschler
at Berner Fachhochschule
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 February 2014 Paper
D. Ernst, M. Peyer, D. Täschler, Patrick Steiner, A. Bossen, B. Považay, Ch. Meier
Proceedings Volume 8938, 89380J (2014) https://doi.org/10.1117/12.2036381
KEYWORDS: Spectroscopy, Polarization, Optical coherence tomography, Cameras, Semiconducting wafers, Interferometers, Fiber couplers, Interferometry, Collimation, Mirrors

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