Dmitri Lapanik
Senior CAD Engineer
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 October 2006 Paper
Proceedings Volume 6349, 63491R (2006) https://doi.org/10.1117/12.688731
KEYWORDS: Scattering, Optical proximity correction, Error analysis, Transistors, Metals, Algorithm development, Systems modeling, Design for manufacturing, Semiconducting wafers, Wafer-level optics

Proceedings Article | 20 May 2006 Paper
Proceedings Volume 6283, 62832S (2006) https://doi.org/10.1117/12.681806
KEYWORDS: Process modeling, Optimization (mathematics), Resolution enhancement technologies, Manufacturing, Optical proximity correction, Photomasks, Calibration, Image processing, Semiconducting wafers, Systems modeling

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