Daniel M. Topa
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 14 October 2004 Paper
Proceedings Volume 5523, (2004) https://doi.org/10.1117/12.561772
KEYWORDS: Wavefront sensors, Wavefronts, Distance measurement, Collimation, Error analysis, Sensors, Monochromatic aberrations, Charge-coupled devices, Manufacturing, Optical testing

Proceedings Article | 24 November 2002 Paper
Daniel Topa, James Gruetzner
Proceedings Volume 4794, (2002) https://doi.org/10.1117/12.453588
KEYWORDS: Data processing, Charge-coupled devices, Wafer testing, Matrices, Semiconducting wafers, Sensors, Wavefront reconstruction, Reconstruction algorithms, Wavefront sensors, Wavefronts

Proceedings Article | 4 November 2002 Paper
Proceedings Volume 4809, (2002) https://doi.org/10.1117/12.450990
KEYWORDS: Semiconducting wafers, Silicon, Polishing, Sensors, Wafer-level optics, Surface finishing, Wavefronts, Interferometers, Interferometry, Manufacturing

Proceedings Article | 4 September 2002 Paper
Proceedings Volume 4769, (2002) https://doi.org/10.1117/12.481180
KEYWORDS: Wavefronts, Wavefront sensors, Silicon, Staring arrays, Charge-coupled devices, Error analysis, Mathematics, Wave propagation, Cameras, Micro optics

Proceedings Article | 4 September 2002 Paper
Proceedings Volume 4769, (2002) https://doi.org/10.1117/12.481179
KEYWORDS: Wavefronts, Wavefront sensors, Sensors, Charge-coupled devices, Wavefront reconstruction, Staring arrays, Reconstruction algorithms, Optical analysis, Data analysis, Zernike polynomials

Showing 5 of 8 publications
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