Dr. Andrey A. Sokolov Profile

Dr. Andrey A. Sokolov

at Helmholtz-Zentrum Berlin

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Author

Publications (11)

Proceedings Article | 9 June 2023 Presentation

On the current state of reflective and diffractive X-ray optical elements and their characterization by means of ex-situ and at-wave-length metrology (Conference Presentation)

Frank Siewert, Jana Buchheim, Grzegorz Gwalt, Analia Fernandez Herrero, Stephanie Lemke, Svyatoslav Alimov, Jeniffa Knedel, Tino Seliger, Thomas Zeschke, Stefan Rehbein, Andrey Sokolov

Proceedings Volume PC12581, PC1258109 (2023) https://doi.org/10.1117/12.2666473

KEYWORDS: Optical components, Metrology, X-rays, X-ray optics, X-ray diffraction, X-ray characterization, Reflectivity, Manufacturing, Mirrors, Free electron lasers

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Proceedings Article | 27 April 2023 Paper

Precise optical constant determination in the soft x-ray, EUV, and VUV spectral range

Najmeh Abbasirad, Qais Saadeh, Richard Ciesielski, Alexander Gottwald, Vicky Philippsen, Igor Makhotkin, Andrey Sokolov, Michael Kolbe, Frank Scholze, Victor Soltwisch

Proceedings Volume 12496, 124963B (2023) https://doi.org/10.1117/12.2659369

KEYWORDS: Optical constants, Vacuum ultraviolet, Ruthenium, Extreme ultraviolet, X-rays, Thin films, Reflectometry, Monte Carlo methods, Film thickness

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Proceedings Article | 13 December 2022 Paper

Ray-tracing simulations of a UV/VUV beamline for the PolFEL free electron laser

Martyna Wardzińska, Henryk Fiedorowicz, Andrzej Bartnik, Tomasz Fok, Przemysław Wachulak, Łukasz Węgrzyński, Karolina Szamota-Leandersson, Jacek Krzywiński, Paweł Krawczyk, Mateusz Majszyk, Peter Baumgärtel, Frank Siewert, Andrey Sokolov

Proceedings Volume 12502, 1250206 (2022) https://doi.org/10.1117/12.2663447

KEYWORDS: Mirrors, Free electron lasers, Ultraviolet radiation, Optical simulations, Vacuum ultraviolet, X-rays, Monochromators, Diffraction gratings

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SPIE Journal Paper | 10 February 2022 Open Access

Laboratory-based reflectometer using line spectra of an RF-induced gas-discharge lamp in 30- to 200-nm wavelength range

Yue Yu, Zeyi Ye, Li Jiang, Qianxia Yao, Shuangying Li, Jiali Wu, Jinlong Zhang, Qiushi Huang, Chun Xie, Andrey Sokolov, Hongjun Zhou, Tonglin Huo, Wenbin Li, Zhanshan Wang

JATIS, Vol. 8, Issue 01, 017002, (February 2022) https://doi.org/10.1117/12.10.1117/1.JATIS.8.1.017002

KEYWORDS: Reflectometry, Reflectivity, Light sources, Lamps, Monochromators, Mirrors, Sensors, Extreme ultraviolet, Collimators, Collimation

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SPIE Journal Paper | 22 November 2021

Design, performance, and utilization of the Low-Energy X-ray Reflectometer at DTU space

Peter Henriksen, Finn Christensen, Sonny Massahi, Desiree D. Ferreira, Sara Svendsen, Nis Gellert, Arne Jegers, Andrey Sokolov, Brian Shortt

JATIS, Vol. 7, Issue 04, 048004, (November 2021) https://doi.org/10.1117/12.10.1117/1.JATIS.7.4.048004

KEYWORDS: Reflectometry, Sensors, Mirrors, X-rays, Reflectivity, Photons, Monochromators, Aluminum, X-ray telescopes, Scattering

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SPIE Journal Paper | 10 April 2021 Open Access

Optical constants of beryllium thin layers determined from Mo/Be multilayers in spectral range 90 to 134 eV

Mewael Giday Sertsu, Andrey Sokolov, Nikolay Chkhalo, Vladimir Polkovnikov, Nikolay Salashchenko, Mikhail Svechnikov, Franz Schäfers

OE, Vol. 60, Issue 04, 044103, (April 2021) https://doi.org/10.1117/12.10.1117/1.OE.60.4.044103

KEYWORDS: Beryllium, Extreme ultraviolet, Reflectivity, Multilayers, Silicon, Absorption, X-rays, Silicon carbide, Molybdenum, Reflectometry

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SPIE Journal Paper | 8 October 2020 Open Access

Comparative study of single-layer, bilayer, and trilayer mirrors with enhanced x-ray reflectance in 0.5- to 8-keV energy region

Yang Yang, Qiushi Huang, Igor Kozhevnikov, Yingyu Liao, Runze Qi, Andrey Sokolov, Zhuangzhuang Zhang, Zhanshan Wang

JATIS, Vol. 6, Issue 04, 044001, (October 2020) https://doi.org/10.1117/12.10.1117/1.JATIS.6.4.044001

KEYWORDS: Reflectivity, Mirrors, Platinum, Telescopes, Coating, Grazing incidence, Nickel, X-rays, Absorption, Reflection

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Proceedings Article | 21 August 2020 Presentation + Paper

Theoretical analysis and development of high efficiency tender x-ray multilayer coated gratings

Yeqi Zhuang, Qiushi Huang, Igor Kozhevnikov, Jiangtao Feng, Runze Qi, Andrey Sokolov, Fredmar Senf, Zhong Zhang, Zhanshan Wang

Proceedings Volume 11493, 114930R (2020) https://doi.org/10.1117/12.2567578

KEYWORDS: Diffraction, Diffraction gratings, X-rays, Grazing incidence, Polarizability, Optical design, Imaging spectroscopy, Energy efficiency, Neodymium

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Proceedings Article | 7 September 2017 Paper

Investigation of HF-plasma-treated soft x-ray optical elements

F. Eggenstein, M. Krivenkov, I. Rudolph, M. Sertsu, A. Sokolov, A. Varykhalov, J. Wolf, T. Zeschke, F. Schäfers

Proceedings Volume 10385, 1038505 (2017) https://doi.org/10.1117/12.2272967

KEYWORDS: Carbon, Metrology, X-rays, X-ray optics, Optical components, Contamination, Reflectometry, Synchrotron radiation, Scanning tunneling microscopy, Reflectivity

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Proceedings Article | 5 September 2014 Paper

A reflectometer for at-wavelength characterization of XUV-reflection gratings

F. Eggenstein, P. Bischoff, A. Gaupp, F. Senf, A. Sokolov, T. Zeschke, F. Schäfers

Proceedings Volume 9206, 920607 (2014) https://doi.org/10.1117/12.2061828

KEYWORDS: Reflectometry, Mirrors, Sensors, Polarization, Extreme ultraviolet, Monochromators, Metrology, Optical components, LabVIEW, Reflectivity

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Proceedings Article | 5 September 2014 Paper

An XUV optics beamline at BESSY II

A. Sokolov, F. Eggenstein, A. Erko, R. Follath, S. Künstner, M. Mast, J. Schmidt, F. Senf, F. Siewert, T. Zeschke, F. Schäfers

Proceedings Volume 9206, 92060J (2014) https://doi.org/10.1117/12.2061778

KEYWORDS: Mirrors, Reflectometry, Monochromators, Metrology, Sensors, Extreme ultraviolet, Diffraction gratings, Reflectivity, Optical components, Collimation

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Showing 5 of 11 publications

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