Mr. Andrew Voshell Profile

Andrew Voshell

Photonics Engineer at JHU/APL

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 12 March 2024 Presentation + Paper

Fiber bundle-based beam tracking demonstrated across 30 km terrestrial FSO communications link

Michelle O'Toole, Andrew Voshell, Krunal Patel, Katherine Newell, Radha Venkat, Parker Coye, John Malowicki

Proceedings Volume 12877, 128770Q (2024) https://doi.org/10.1117/12.2692398

KEYWORDS: Receivers, Free space optics, Sensors, Data modeling, Beam path, Turbulence, Optical tracking, Atmospheric modeling, Cameras, Single mode fibers

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Proceedings Article | 12 March 2024 Presentation + Paper

Hybrid FSO/RF communications system demonstrated across degraded 30 km link with integrated commercial radio

Raef Youssef, Krunal Patel, Michelle O’Toole, Andrew Voshell, Katherine Newell, John Malowicki

Proceedings Volume 12877, 128770R (2024) https://doi.org/10.1117/12.2692399

KEYWORDS: Free space optics, Data transmission, Automatic repeat request, Telecommunications, Switches, RF communications, Free space optical communications, Field programmable gate arrays, Data communications, Wireless communications

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Proceedings Article | 7 September 2018 Paper

Review of optical properties of two-dimensional transition metal dichalcogenides

Andrew Voshell, Mauricio Terrones, Mukti Rana

Proceedings Volume 10754, 107540L (2018) https://doi.org/10.1117/12.2323132

KEYWORDS: Molybdenum, Absorbance, Photodetectors, Excitons, Absorption, Semiconductors, Phototransistors, Transition metals, Sensors, Optical properties

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Proceedings Article | 23 August 2017 Paper

Properties of reactively sputtered AlxNy thin films for pyroelectric detectors

Nicholas Calvano, Philip Chrostoski, Andrew Voshell, Keesean Braithwaite, Mukti Rana

Proceedings Volume 10381, 103810J (2017) https://doi.org/10.1117/12.2281240

KEYWORDS: Aluminum, Thin films, Refractive index, Pyroelectric detectors, Polarization, Scanning electron microscopy, Temperature metrology, Capacitors, Sputter deposition, Transmittance

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Proceedings Article | 28 April 2017 Presentation + Paper

Radio frequency sputtered AlxNy thin films for thermal detectors

Nicholas Calvano, Philip Chrostoski, Andrew Voshell, Keesean Braithwaite, Dennis Prather, Murzy Jhabvala, Mukti Rana

Proceedings Volume 10209, 102090J (2017) https://doi.org/10.1117/12.2267089

KEYWORDS: Pyroelectric detectors, Infrared detection, Infrared sensors, Aluminum nitride, Aluminum, Sputter deposition, Temperature metrology, Silicon, Dielectric polarization

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