Alfons Zoeller
Dipl. Ing. at Bühler Alzenau GmbH
SPIE Involvement:
Author
Publications (18)

Proceedings Article | 24 June 2024 Presentation + Paper
Detlef Arhilger, Harro Hagedorn, Alfons Zöller
Proceedings Volume 13020, 130200Q (2024) https://doi.org/10.1117/12.3021834
KEYWORDS: Ultraviolet radiation, Optical sensing, Coating, Deep ultraviolet, UV optics, Lamps, Plasma, Glasses, Film thickness

Proceedings Article | 23 September 2015 Paper
D. Arhilger, H. Hagedorn, H. Reus, A. Zöller
Proceedings Volume 9627, 96270O (2015) https://doi.org/10.1117/12.2191344
KEYWORDS: Silica, Ions, Plasma, Energy efficiency, Optical coatings, Refractive index, Argon, Neodymium, Scattering, Titanium dioxide

Proceedings Article | 23 September 2015 Paper
Alfons Zöller, Detlef Arhilger, Michael Boos, Harro Hagedorn
Proceedings Volume 9627, 962712 (2015) https://doi.org/10.1117/12.2191269
KEYWORDS: Spectroscopy, Sensors, Control systems, Transmittance, Glasses, Detector arrays, Signal detection, Interference (communication), Optical coatings, Light

Proceedings Article | 5 October 2011 Paper
A. Zoeller, H. Hagedorn, W. Weinrich, E. Wirth
Proceedings Volume 8168, 81681J (2011) https://doi.org/10.1117/12.896859
KEYWORDS: Transmittance, Coating, Multilayers, Glasses, Computer simulations, Optical testing, Optical filters, Crystal optics, Monochromators, Thin films

Proceedings Article | 25 September 2008 Paper
A. Zöller, M. Boos, H. Hagedorn, B. Romanov
Proceedings Volume 7101, 71010G (2008) https://doi.org/10.1117/12.797612
KEYWORDS: Coating, Computer simulations, Refractive index, Transmittance, Error analysis, Interference (communication), Multilayers, Linear filtering, Sputter deposition, Signal processing

Showing 5 of 18 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top