Dr. Alexander Gottwald Profile

Dr. Alexander Gottwald

Researcher at Physikalisch-Technische Bundesanstalt

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Publications (13)

Proceedings Article | 4 October 2023 Presentation

Investigating the sensitivity of optical constant determination in the vacuum ultraviolet spectral range to s- and p-polarized reflectance

Najmeh Abbasirad, Udo Kroth, Qais Saadeh, Richard Ciesielski, Alexander Gottwald, Vicky Philipsen, Frank Scholze, Victor Soltwisch, Mattia Mulazzi

Proceedings Volume PC12695, PC1269507 (2023) https://doi.org/10.1117/12.2681821

KEYWORDS: Vacuum ultraviolet, Reflectivity, Refractive index, Reflectance spectroscopy, Polarization, Absorption, Thin films, Spectroscopy, Semiconductors, Semiconductor manufacturing

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Proceedings Article | 27 April 2023 Paper

Precise optical constant determination in the soft x-ray, EUV, and VUV spectral range

Najmeh Abbasirad, Qais Saadeh, Richard Ciesielski, Alexander Gottwald, Vicky Philippsen, Igor Makhotkin, Andrey Sokolov, Michael Kolbe, Frank Scholze, Victor Soltwisch

Proceedings Volume 12496, 124963B (2023) https://doi.org/10.1117/12.2659369

KEYWORDS: Optical constants, Vacuum ultraviolet, Ruthenium, Extreme ultraviolet, X-rays, Thin films, Reflectometry, Monte Carlo methods, Film thickness

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Proceedings Article | 13 December 2020 Presentation + Paper

Calibrating Teledyne-e2v’s ultraviolet image sensor quantum efficiency processes

Julian Heymes, Matthew Soman, Thomas Buggey, Chiaki Crews, George Randall, Alexander Gottwald, Andrew Harris, Andrew Kelt, Udo Kroth, Ian Moody, Xiao Meng, Oskar Ogor, Andrew Holland

Proceedings Volume 11454, 114541G (2020) https://doi.org/10.1117/12.2559711

KEYWORDS: Ultraviolet radiation, Image processing, Quantum efficiency, Calibration, Image sensors, Sensors, X-ray optics, X-rays, Wafer-level optics, Reflectivity

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Proceedings Article | 6 July 2018 Presentation + Paper

The EUI flight instrument of Solar Orbiter: from optical alignment to end-to-end calibration

J.-P. Halain, E. Renotte, F. Auchère, D. Berghmans, F. Delmotte, L. Harra, W. Schmutz, U. Schühle, R. Aznar Cuadrado, C. Dumesnil, M. Gyo, T. Kennedy, C. Verbeeck, J. Barbay, B. Giordanengo, S. Gissot , A. Gottwald, K. Heerlein, M.-L. Hellin, A. Hermans, V. Hervier, L. Jacques, C. Laubis, A. Mazzoli, S. Meining, R. Mercier, A. Philippon, S. Roose, L. Rossi, F. Scholze, P. Smith, L. Teriaca, X. Zhang, P. Rochus

Proceedings Volume 10699, 106990H (2018) https://doi.org/10.1117/12.2309339

KEYWORDS: Extreme ultraviolet, Calibration, Cameras, Mirrors, Optical alignment, Sensors, Telescopes, Interferometry, Fermium, Frequency modulation

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Proceedings Article | 18 July 2016 Paper

Developments in calibration of EUV and VUV detectors for solar orbiter instrumentation using synchrotron radiation

Thomas Reichel, Alexander Gottwald, Udo Kroth, Christian Laubis, Frank Scholze

Proceedings Volume 9905, 990547 (2016) https://doi.org/10.1117/12.2231405

KEYWORDS: Sensors, Calibration, Clocks, Diodes, Logic, Capacitors, Spectroscopy, Particles, Ions, Resistors

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Proceedings Article | 26 September 2013 Paper

SPICE EUV spectrometer for the Solar Orbiter mission

A. Fludra, D. Griffin, M. Caldwell, P. Eccleston, J. Cornaby, D. Drummond, W. Grainger, P. Greenway, T. Grundy, C. Howe, C. McQuirk, K. Middleton, O. Poyntz-Wright, A. Richards, K. Rogers, C. Sawyer, B. Shaughnessy, S. Sidher, I. Tosh, S. Beardsley, G. Burton, A. Marshall, N. Waltham, S. Woodward, T. Appourchaux, A. Philippon, F. Auchere, E. Buchlin, A. Gabriel, J.-C. Vial, U. Schühle, W. Curdt, D. Innes, S. Meining, H. Peter, S. Solanki, L. Teriaca, M. Gyo, V. Büchel, M. Haberreiter, D. Pfiffner, W. Schmutz, M. Carlsson, S. Haugan, J. Davila, P. Jordan, W. Thompson, D. Hassler, B. Walls, C. Deforest, J. Hanley, J. Johnson, P. Phelan, L. Blecha, H. Cottard, G. Paciotti, N. Autissier, Y. Allemand, K. Relecom, G. Munro, A. Butler, R. Klein, A. Gottwald

Proceedings Volume 8862, 88620F (2013) https://doi.org/10.1117/12.2027581

KEYWORDS: Mirrors, Sensors, Solar processes, Spectroscopy, Space operations, Plasmas, Sun, Extreme ultraviolet, Space telescopes, Telescopes

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Proceedings Article | 14 September 2011 Paper

High-sensitivity high-stability silicon photodiodes for DUV, VUV and EUV spectral ranges

L. Shi, S. Nihtianov, F. Scholze, A. Gottwald, L. Nanver

Proceedings Volume 8145, 81450N (2011) https://doi.org/10.1117/12.891865

KEYWORDS: Extreme ultraviolet, Silicon, Vacuum ultraviolet, Photodiodes, Boron, Deep ultraviolet, Diodes, Extreme ultraviolet lithography, Photodetectors, Ultraviolet radiation

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Proceedings Article | 17 July 2010 Paper

Quantum efficiency measurements of eROSITA pnCCDs

Stefanie Ebermayer, Robert Andritschke, Johannes Elbs, Norbert Meidinger, Lothar Strüder, Robert Hartmann, Alexander Gottwald, Michael Krumrey, Frank Scholze

Proceedings Volume 7742, 77420U (2010) https://doi.org/10.1117/12.856939

KEYWORDS: Quantum efficiency, Photons, Absorption, Sensors, X-rays, Aluminum, Signal attenuation, Silicon, Monochromators, Semiconductors

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Proceedings Article | 10 November 2004 Paper

FEL beam metrology with a gas-monitor detector

Alexander Gottwald, SergeJ Bobashev, Ulrich Hahn, Arne Hoehl, Ulf Jastrow, Mathias Richter, Andrej Sorokin, Kai Tiedtke

Proceedings Volume 5534, (2004) https://doi.org/10.1117/12.556289

KEYWORDS: Sensors, Calibration, Free electron lasers, Signal detection, Particles, Ions, Xenon, Radiometry, Synchrotron radiation, Extreme ultraviolet

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Proceedings Article | 14 October 2004 Paper

High-accuracy VUV reflectometry at selectable sample temperatures

Alexander Gottwald, Udo Kroth, Martin Letz, Hendrik Schoppe, Mathias Richter

Proceedings Volume 5538, (2004) https://doi.org/10.1117/12.556301

KEYWORDS: Reflectometry, Temperature metrology, Reflectivity, Crystals, Excitons, Sensors, Vacuum ultraviolet, Absorption, Synchrotron radiation, Anisotropy

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Proceedings Article | 4 February 2004 Paper

Development of imaging arrays for solar UV observations based on wide band gap materials

Udo Schuehle, Jean-Francois Hochedez, Jose Luis Pau, Carlos Rivera, Elias Munoz, Jose Alvarez, Jean-Paul Kleider, Philippe Lemaire, Thierry Appourchaux, Bernhard Fleck, Anthony Peacock, Mathias Richter, Udo Kroth, Alexander Gottwald, Marie-Claude Castex, Alain Deneuville, Pierre Muret, Milos Nesladek, Franck Omnes, Joachim John, Chris Van Hoof

Proceedings Volume 5171, (2004) https://doi.org/10.1117/12.507730

KEYWORDS: Sensors, Ultraviolet radiation, Diamond, Vacuum ultraviolet, Charge-coupled devices, Microchannel plates, Photodiodes, Imaging arrays, Visible radiation, Photons

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Proceedings Article | 20 December 2001 Paper

Lifetime testing of EUV optics using intense synchrotron radiation at the PTB Radiometry Laboratory

Roman Klein, Alexander Gottwald, Frank Scholze, R. Thornagel, Johannes Tuemmler, Gerhard Ulm, Marco Wedowski, Frank Stietz, Bas Mertens, Norbert Koster, J. van Elp

Proceedings Volume 4506, (2001) https://doi.org/10.1117/12.450950

KEYWORDS: Mirrors, Reflectivity, Extreme ultraviolet, EUV optics, Optical filters, Extreme ultraviolet lithography, Synchrotron radiation, Radiometry, Lithography, Reflectometry

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Proceedings Article | 22 August 2001 Paper

High-accuracy EUV metrology of PTB using synchrotron radiation

Frank Scholze, Burkhard Beckhoff, G. Brandt, R. Fliegauf, Alexander Gottwald, Roman Klein, Bernd Meyer, U. Schwarz, R. Thornagel, Johannes Tuemmler, Klaus Vogel, J. Weser, Gerhard Ulm

Proceedings Volume 4344, (2001) https://doi.org/10.1117/12.436766

KEYWORDS: Mirrors, Extreme ultraviolet, Metrology, Monochromators, Reflectometry, Sensors, Diffraction, Radiometry, Reflectivity, Optical filters

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Showing 5 of 13 publications

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