Prof. Abdel Rahman M. Zaghloul Profile

Prof. Abdel Rahman M. Zaghloul

SPIE Involvement:

Author | Instructor

Proceedings Article | 18 June 2014 Paper

No-hardware-signature cybersecurity-crypto-module: a resilient cyber defense agent

A. R. M. Zaghloul, Y. Zaghloul

Proceedings Volume 9097, 90970M (2014) https://doi.org/10.1117/12.2063319

KEYWORDS: Switches, Polarization, Defense and security, Logic, Polarizers, Networks, Beam splitters, Logic devices, Single sideband modulation, Patents

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Proceedings Article | 21 May 2014 Paper

Single-instrument morphology: single-element polarizer (SEP) ellipsometers, reflecsometers, elliptometers, and reflectometers

A. R. Zaghloul, M Elshazly-Zaghloul

Proceedings Volume 9099, 909919 (2014) https://doi.org/10.1117/12.2057639

KEYWORDS: Polarizers, Signal detection, Reflectometry, Ellipsometry, Sensors, Telecommunications, Polarization, Reflection, Numerical analysis, Electromagnetic radiation

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Proceedings Article | 27 September 2013 Paper

Single-angle-of-incidence single-element rotating-polarizer (Single SERP) ellipsometer for film-substrate systems

A. R. Zaghloul

Proceedings Volume 8873, 887304 (2013) https://doi.org/10.1117/12.2024977

KEYWORDS: Signal detection, Genetic algorithms, Ellipsometry, Refractive index, Polarizers, Sensors, Polarization, Numerical analysis, Reflection, Mathematics

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Proceedings Article | 18 October 2007 Paper

Transmission ellipsometry on unsupported film/pellicle: closed-form inversion

A. R. Zaghloul, M. Elshazly-Zaghloul, Y. Zaghloul

Proceedings Volume 6682, 66820J (2007) https://doi.org/10.1117/12.736352

KEYWORDS: Refractive index, Ellipsometry, Pellicles, Polarizers, Signal detection, Numerical analysis, Sensors, Numerical simulations, Polarization, Electromagnetic radiation

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We present a brief discussion of the transmission ellipsometric function of an unsupported film/pellicle optical structure. We also briefly discuss different ellipsometric techniques that could be used to characterize an unsupported film/pellicle. The current state of data reduction either uses forward curve-fitting techniques or other numerical methods to obtain the refractive index of the optical slab and its thickness. Both methods are dependent on a good starting point and use an iterative approach to minimize a merit function that consumes much valuable time and memory resources. We present closed-form formulas to obtain both the refractive index and thickness. We spare the reader successive and involved transformations and algebraic manipulations to arrive at the closed forms. We provide the reader with an easy-to- follow step-by-step algorithm to obtain the system parameters. Also, we present a closed-form formula for the refractive index using two, and more, sets of measurements. In addition, we discuss the effect of film-thickness multiplicity and its separation. Other technique-specific closed-form formulas are given for different ellipsometric techniques. We also present numerical simulation results that prove the accuracy of the closed-form formulas, and that revealed an interesting and useful characteristic that we utilize. We close by introducing a closed-form formula to calculate the ratio of the unsupported film/pellicle to that of the ambient, which could be used to determine either experimentally. The advantages of closed-form inversion over forward curve fitting and numerical methods are numerous, including: 1) a much higher speed of obtaining the problem solution that allows for real-time applications, 2) it does not require human judgments or intervention, 3) absolute stability, 4) much higher accuracy, 5) no need for close-to-solution starting values of the unknown parameter(s), 6) no errors introduced by the formulas themselves, 7) smart, simple, and concise software programs, 8) use in new material characterization where starting-point-dependent numerical methods fail or require much trial and error.

Proceedings Article | 20 September 2007 Paper

Design of half and full optical binary adders using the polarization optical processor architecture

Y. Zaghloul, A. R. M. Zaghloul, A. Adibi

Proceedings Volume 6695, 669509 (2007) https://doi.org/10.1117/12.736351

KEYWORDS: Polarization, Binary data, Logic, Wave plates, Phase shifts, Polarizers, Beam splitters, Electromagnetic radiation, Computer architecture, Patents

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Proceedings Article | 20 September 2007 Paper

Polarization optical processor, binary optical gates, wave polarization, thin films, and ellipsometry

Y. Zaghloul, A. R. Zaghloul

Proceedings Volume 6695, 66950A (2007) https://doi.org/10.1117/12.736350

KEYWORDS: Polarization, Polarizers, Binary data, Logic, Ellipsometry, Wave plates, Electromagnetic radiation, Control systems, Reflection, Thin films

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Proceedings Article | 28 August 2006 Paper

Transmission ellipsometry of transparent-film transparent-substrate systems: polynomial inversion for the substrate optical constant

M. Elshazly-Zaghloul, Y. Zaghloul, A. R. M. Zaghloul

Proceedings Volume 6286, 62860G (2006) https://doi.org/10.1117/12.681006

KEYWORDS: Ellipsometry, Interfaces, Reflection, Manufacturing, Electromagnetic radiation, Polarization, Inspection, Computing systems, Thin films, Refraction

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Proceedings Article | 28 August 2006 Paper

X-measuring ellipsometer (XME): a novel ellipsometric technique to fully characterize film-substrate systems

A. R. M. Zaghloul, Y. Zaghloul

Proceedings Volume 6286, 62860M (2006) https://doi.org/10.1117/12.680972

KEYWORDS: Reflection, Ellipsometry, Computing systems, Electromagnetic radiation, Polarizers, Photodetectors, Polarization, Interfaces, Beam splitters, Phase shifts

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Proceedings Article | 3 May 2006 Paper

Transmission ellipsometry of transparent-film transparent-substrate systems: closed-form inversion for the film optical constant

A. R. M. Zaghloul, M. Elshazly-Zaghloul, Y. Zaghloul

Proceedings Volume 6240, 62400M (2006) https://doi.org/10.1117/12.666777

KEYWORDS: Ellipsometry, Reflection, Refraction, Manufacturing, Error analysis, Polarization, Algorithm development, Computing systems, Computer engineering, Analytical research

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Proceedings Article | 3 May 2006 Paper

Transmission polarization devices using an unsupported film/pellicle: closed-form design formula

A. R. M. Zaghloul, M. Elshazly-Zaghloul

Proceedings Volume 6240, 62400O (2006) https://doi.org/10.1117/12.666785

KEYWORDS: Polarization, Signal attenuation, Pellicles, Telescopic pixel displays, Phase shifts, Polarizers, Glasses, Electromagnetic radiation, Reflection, Wave plates

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Proceedings Article | 5 October 2005 Paper

Genetic algorithm design of reflection thin-film coatings and polarization-devices

A. R. Zaghloul, Y. Zaghloul

Proceedings Volume 5963, 59632E (2005) https://doi.org/10.1117/12.627432

KEYWORDS: Polarization, Reflection, Thin film coatings, Genetic algorithms, Thin films, Polarizers, Thin film devices, Signal attenuation, Wave plates, Phase shifts

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Proceedings Article | 5 October 2005 Paper

Thin-film coatings and transmission-polarization-devices: negative system

A. R. Zaghloul, M. Elshazly-Zaghloul

Proceedings Volume 5963, 596307 (2005) https://doi.org/10.1117/12.627426

KEYWORDS: Polarization, Thin film coatings, Thin films, Electromagnetic radiation, Telescopic pixel displays, Signal attenuation, Thin film devices, Telecommunications, Polarizers, Phase shifts

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Proceedings Article | 1 September 2005 Paper

A fast genetic algorithm to fully characterize transparent-film-absorbing-substrate systems using ellipsometry

A. Zaghloul, Y. Zaghloul

Proceedings Volume 5878, 58780F (2005) https://doi.org/10.1117/12.620665

KEYWORDS: Tolerancing, Ellipsometry, Genetic algorithms, Error analysis, Picosecond phenomena, System identification, Electromagnetic radiation, Reflection, Refractive index, Telecommunications

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Proceedings Article | 19 August 2005 Paper

Design of transmission linear partial polarizers using a negative film-substrate system

A. Zaghloul, W. Berzett, D. Keeling

Proceedings Volume 5870, 58700N (2005) https://doi.org/10.1117/12.619707

KEYWORDS: Polarizers, Thin films, Refractive index, Tolerancing, Polarization, Signal attenuation, Thin film coatings, Computing systems, Thin film devices, Interfaces

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Proceedings Article | 29 September 2004 Paper

Design of reflection-retarders using non-negative film-substrate systems

A. R. M. Zaghloul, Jamie Mason

Proceedings Volume 5527, (2004) https://doi.org/10.1117/12.562952

KEYWORDS: Wave plates, Reflection, Scanning probe microscopy, Reflectivity, Refractive index, Polarization, Grazing incidence, Optical components, Phase shifts, Ellipsometry

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Showing 5 of 15 publications

Course Instructor

SC1005: Ellipsometry for Thin Film Metrology

This course explains the basic principles and concepts of ellipsometry for thin film diagnostics. A primary goal of the course is to reveal the logic, structure, and methodology behind this useful branch of optical science and engineering. Anyone who wants to answer questions such as, "what can I measure with ellipsometry", "which ellipsometric technique to use?" or "how much confidence is there in the data obtained?" will benefit from taking this course. It unlocks the doors for understanding and using ellipsometry in practical situations.

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