We provide an analysis of the existing methods for calculating parasitic illumination, methods for its analysis, and visualization. To search for and analyze the sources of stray light in optical devices, a software model of the beam propagation criterion in an optical device is proposed, which makes it possible to select beams that satisfy a given criterion. We consider the possibility of using the method of bidirectional progressive stochastic ray tracing with inverse photon maps to calculate the stray illumination of an image and analyze the causes of its occurrence. To analyze the sources of stray illumination on the radiation detector, it was proposed to use progressive photon maps, which calculated the caustic and secondary components of the illumination and fixed the image illumination on a static regular mesh attached to the surfaces of the optical device. Special visualization tools allow the display of this illumination over the image of an optical device and determination of the elements of the device that have the greatest impact on the level of stray illumination of the image. We present examples of calculation, analysis, and visualization of parasitic illumination of a number of optical systems of lenses with real mechanical structures.