Calibration of the modulation transfer function of surface profilometers with binary pseudorandom test standards: expanding the application range to Fizeau interferometers and electron microscopes

Valeriy V. Yashchuk; Samuel K. Barber; Wayne R. McKinney; Dmitriy L. Voronov; Erik H. Anderson; Nathalie Bouet; Raymond Conley Jr.; Rossana Cambie; Peter Z. Takacs

doi:10.1117/1.3622485

1 September 2011 Calibration of the modulation transfer function of surface profilometers with binary pseudorandom test standards: expanding the application range to Fizeau interferometers and electron microscopes

Valeriy V. Yashchuk, Samuel K. Barber, Wayne R. McKinney, Dmitriy L. Voronov, Erik H. Anderson, Nathalie Bouet, Raymond Conley Jr., Rossana Cambie, Peter Z. Takacs

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Optical Engineering, Vol. 50, Issue 9, 093604 (September 2011). https://doi.org/10.1117/1.3622485

Abstract

A modulation transfer function (MTF) calibration method based on binary pseudorandom (BPR) gratings and arrays has been proven to be an effective MTF calibration method for interferometric microscopes and a scatterometer. Here we report on a further expansion of the application range of the method. We describe the MTF calibration of a 6 in. phase shifting Fizeau interferometer. Beyond providing a direct measurement of the interferometer's MTF, tests with a BPR array surface have revealed an asymmetry in the instrument's data processing algorithm that fundamentally limits its bandwidth. Moreover, the tests have illustrated the effects of the instrument's detrending and filtering procedures on power spectral density measurements. The details of the development of a BPR test sample suitable for calibration of scanning and transmission electron microscopes are also presented. Such a test sample is realized as a multilayer structure with the layer thicknesses of two materials corresponding to the BPR sequence. The investigations confirm the universal character of the method that makes it applicable to a large variety of metrology instrumentation with spatial wavelength bandwidths from a few nanometers to hundreds of millimeters.

©(2011) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Valeriy V. Yashchuk, Samuel K. Barber, Wayne R. McKinney, Dmitriy L. Voronov, Erik H. Anderson, Nathalie Bouet, Raymond Conley Jr., Rossana Cambie, and Peter Z. Takacs "Calibration of the modulation transfer function of surface profilometers with binary pseudorandom test standards: expanding the application range to Fizeau interferometers and electron microscopes," Optical Engineering 50(9), 093604 (1 September 2011). https://doi.org/10.1117/1.3622485

Published: 1 September 2011

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