Line width measurement of semiconductor lasers using quantum interference in electromagnetically induced transparency: a quantum heterodyning method

S. M. Iftiquar

doi:10.1117/1.2948312

1 June 2008 Line width measurement of semiconductor lasers using quantum interference in electromagnetically induced transparency: a quantum heterodyning method

S. M. Iftiquar

Author Affiliations +

Optical Engineering, Vol. 47, Issue 6, 064201 (June 2008). https://doi.org/10.1117/1.2948312

Abstract

A technique is described in which electromagnetically induced transparency (EIT) spectra are used to measure laser line width. Two independent sets of EIT measurements are carried out in the presence of ⁸⁵Rb and ⁸⁷Rb atomic isotopes. Conventional self-heterodyning detection is used to obtain standard values of laser line width. A comparison shows that the estimated laser line widths in these measurements are very close to each other.

©(2008) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

S. M. Iftiquar "Line width measurement of semiconductor lasers using quantum interference in electromagnetically induced transparency: a quantum heterodyning method," Optical Engineering 47(6), 064201 (1 June 2008). https://doi.org/10.1117/1.2948312

Published: 1 June 2008

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