Determination of strains from fringe patterns using space-frequency representations

Cesar A. Sciammarella; Taeeui Kim

doi:10.1117/1.1613276

1 November 2003 Determination of strains from fringe patterns using space-frequency representations

Cesar A. Sciammarella, Taeeui Kim

Optical Engineering, Vol. 42, Issue 11, (November 2003). https://doi.org/10.1117/1.1613276

A new approach to the retrieval of fringe pattern frequency information is introduced. In this approach, strain information is extracted from fringe patterns by using either short-time Fourier transforms or wavelets. Space-frequency representation of the fringe signals is introduced as a tool to get the space localization of the strains. The idea of spectral energy density maxima to define the instantaneous frequency (ridge points) is presented. Examples of application are given. Results show that this approach provides an excellent tool for pattern analysis.

©(2003) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Cesar A. Sciammarella and Taeeui Kim "Determination of strains from fringe patterns using space-frequency representations," Optical Engineering 42(11), (1 November 2003). https://doi.org/10.1117/1.1613276

Published: 1 November 2003

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