Photorefractive recording of subwavelength-size binary data using near-field scanning optical microscopy

Kyoung-Youm Kim; Jingu Kang; Byoungho Lee

doi:10.1117/1.1488605

1 August 2002 Photorefractive recording of subwavelength-size binary data using near-field scanning optical microscopy

Kyoung-Youm Kim, Jingu Kang, Byoungho Lee

Optical Engineering, Vol. 41, Issue 8, (August 2002). https://doi.org/10.1117/1.1488605

We propose a way of single-beam photorefractive recording of subwavelength-size binary optical data using near-field scanning optical microscopy (NSOM). Data are recorded in the form of pure (without any change in the topography of the surface) refractive index changes induced near the surface of photorefractive crystal by the light intensity distribution from the subwavelength-size fiber tip of the NSOM. This change in the refractive index can modify the transmission characteristics of the NSOM. Therefore, the characteristics of the reading beam depend on whether the light from the tapered fiber tip was previously exposed (recorded) or not, and thus can be regarded as on-off (binary) data.

©(2002) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Kyoung-Youm Kim, Jingu Kang, and Byoungho Lee "Photorefractive recording of subwavelength-size binary data using near-field scanning optical microscopy," Optical Engineering 41(8), (1 August 2002). https://doi.org/10.1117/1.1488605

Published: 1 August 2002

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