Apertureless near-field optical microscope in reflection and transmission modes

Reda Laddada; Pierre Michel Adam; Pascal Royer; Jean Louis Bijeon

doi:10.1117/1.601720

1 July 1998 Apertureless near-field optical microscope in reflection and transmission modes

Reda Laddada, Pierre Michel Adam, Pascal Royer, Jean Louis Bijeon

Optical Engineering, Vol. 37, Issue 7, (July 1998). https://doi.org/10.1117/1.601720

Apertureless Scanning Near-field Optical Microscope (SNOM) receives an increasing interest in local imaging and analysis. We report a hybrid microscope composed of a commercial Atomic Force Microscope (AFM) and an apertureless SNOM, which operates both in reflection and transmission modes with several illumination and collection systems. The optical probe is a commercial AFM tip integrated on a silicon cantilever. The AFM is operated in the intermittent contact mode at the resonance frequency of the cantilever. We present the images obtained on a grating of cylindrical dots of aluminum (diameter is 200 nm, height is 20 nm) and we show the effects of some optical parameters (polarization, direction of illumination and collection) on the SNOM images.

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Reda Laddada, Pierre Michel Adam, Pascal Royer, and Jean Louis Bijeon "Apertureless near-field optical microscope in reflection and transmission modes," Optical Engineering 37(7), (1 July 1998). https://doi.org/10.1117/1.601720

Published: 1 July 1998

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