Elimination of artifacts in interline charge-coupled devices imagers

Bojan T. Turko; George J. Yates

doi:10.1117/12.55959

1 October 1991 Elimination of artifacts in interline charge-coupled devices imagers

Bojan T. Turko, George J. Yates

Author Affiliations +

Optical Engineering, Vol. 30, Issue 10, (October 1991). https://doi.org/10.1117/12.55959

Abstract

Charge-coupled devices (CCDs) of interline transfer design are especially useful in imaging at high frame rates. However, their sensitivity to ionization radiation and the reduced effective opacity of vertical charge transfer registers cause undesired image artifacts. Random white spots from the radiation and "ghost" images (or smear) generated in the registers may severely impair the image quality. An electronic method of eliminating these artifacts is described. Special sequences of pulses clock the CCD, quickly dumping the unwanted charge. The fast readout of images, cleared of artifacts, follows immediately. Results obtained with the Fairchild Weston CCD 222 imager are shown.

Citation Download Citation

Bojan T. Turko and George J. Yates "Elimination of artifacts in interline charge-coupled devices imagers," Optical Engineering 30(10), (1 October 1991). https://doi.org/10.1117/12.55959

Published: 1 October 1991

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