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1 August 1984 Guest Editorial: Precision Surface Metrology
James C. Wyant
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Optical Engineering, Vol. 23, Issue 4, 234349 (August 1984). https://doi.org/10.1117/12.7973297
Abstract
During the past two decades there have been many changes in precision surface metrology. The introduction of the laser and the large computer during the 1960s and 1970s produced many changes in testing capabilities and requirements. Several commercial interferometers became available in the 1970s, enabling people who were not necessarily experts in interferometry to use interferometers to produce better optics. Since both buyers and sellers could test optics, the quality of the optics manufactured and sold improved greatly. If a person ordered 1/10 wave optics, he would probably get 1/10 wave or better optics; if he got optics of lower quality, he would know it, and he could prove it and return it.
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James C. Wyant "Guest Editorial: Precision Surface Metrology," Optical Engineering 23(4), 234349 (1 August 1984). https://doi.org/10.1117/12.7973297
Published: 1 August 1984
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KEYWORDS
Optics manufacturing
Metrology
Interferometers
Interferometry
Optical testing
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