30 May 2024 Structure effects of silicon-containing antireflection coatings
Peng Dong, Ying Lu, Tianhao Li, Yujie Song
Author Affiliations +
Abstract

A silicon containing antireflection coating (SiARC) can effectively suppress standing waves when the photoresist thickness is limited, but the relationship between polymer structures and optical parameters is not clear. High-silicon-content polysiloxanes were synthesized by sol–gel processing, and SiARC was prepared by spin-coating method. The influence of Si/Ph on the optical parameters (n and k values) of SiARC was investigated. Finally, the effect of silicon content on the etching rate of fluorine ion and oxygen ion was studied.

© 2024 Society of Photo-Optical Instrumentation Engineers (SPIE)
Peng Dong, Ying Lu, Tianhao Li, and Yujie Song "Structure effects of silicon-containing antireflection coatings," Journal of Micro/Nanopatterning, Materials, and Metrology 23(2), 024602 (30 May 2024). https://doi.org/10.1117/1.JMM.23.2.024602
Received: 21 February 2024; Accepted: 10 May 2024; Published: 30 May 2024
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KEYWORDS
Silicon

Etching

Antireflective coatings

Photoresist materials

Lithography

Polymers

Film thickness

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