Presentation
3 October 2024 Planck-enhanced filter spectroscopy: Using temperature-dependent thermal radiation to improve the spectral resolution of filter-based spectroscopy systems (Conference Presentation)
Jonathan L. King, Yuzhe Xiao, Mikhail Kats
Author Affiliations +
Abstract
The emissivity, reflection, or transmittance of media in the infrared can be measured using a filter spectrometer, which typically consists of an incandescent light source, filters, and one or more detectors. In the case of a focal-plane array of detectors, this configuration can be a multispectral or hyperspectral camera. We demonstrate that the spectral resolution of this simple system can be significantly improved when the temperature of the incandescent source is varied and tracked, i.e. via “Planck enhancement”.
Conference Presentation
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jonathan L. King, Yuzhe Xiao, and Mikhail Kats "Planck-enhanced filter spectroscopy: Using temperature-dependent thermal radiation to improve the spectral resolution of filter-based spectroscopy systems (Conference Presentation)", Proc. SPIE PC13145, Infrared Sensors, Devices, and Applications XIV, PC1314506 (3 October 2024); https://doi.org/10.1117/12.3028485
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KEYWORDS
Optical filters

Spectroscopy

Tunable filters

Spectral resolution

Bandpass filters

Infrared sensors

Temperature metrology

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