Results from the characterization tests of p-channel skipper-CCDs fabricated on 8-inch wafers

Brenda Aurea Cervantes Vergara; Juan Cruz Estrada

doi:10.1117/12.3019304

28 August 2024 Results from the characterization tests of p-channel skipper-CCDs fabricated on 8-inch wafers

Brenda Aurea Cervantes Vergara, Juan Cruz Estrada

Proceedings Volume PC13103, X-Ray, Optical, and Infrared Detectors for Astronomy XI; PC131030E (2024) https://doi.org/10.1117/12.3019304
Event: SPIE Astronomical Telescopes + Instrumentation, 2024, Yokohama, Japan

Abstract

Skipper-CCDs, with their electron-counting capability and low instrumental background, are highly sensitive to faint signals, which is of great interest for certain astronomical applications. Characterizing the instrumental sources of few-e- events in skipper-CCDs is crucial for estimating their scientific reach. In this work I will report on the performance of fully-depleted, p-channel skipper-CCDs, that were fabricated on 8-inch wafers in two new foundries during the R&D of Oscura, a 26 GPix skipper-CCD array designed to search for light dark matter-electron interactions. Results, performed at FNAL, demonstrate a high yield of sensors achieving sub-electron readout noise. Main instrumental sources of few-e- events were identified and characterized, including thermal dark current, spurious charge and charge traps.

Conference Presentation

Citation Download Citation

Brenda Aurea Cervantes Vergara and Juan Cruz Estrada "Results from the characterization tests of p-channel skipper-CCDs fabricated on 8-inch wafers", Proc. SPIE PC13103, X-Ray, Optical, and Infrared Detectors for Astronomy XI, PC131030E (28 August 2024); https://doi.org/10.1117/12.3019304

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