We report the first time nanoscale, tip enhanced Raman scattering (TERS) imaging of the SeMoS Janus monolayers crystals both as-grown on gold foil and transferred from the growth substrate to the gold-coated silicon wafers. Due to the preferential enhancement of the out-of-plane modes in the gap-mode of TERS, the TERS spectra of SeMoS differ from the conventional Raman spectra reported earlier [1 , 2]. The A11and A12 out-of-plane modes are shown to be the first and the second strongest Raman peaks in TERS, while in conventional Raman spectroscopy the A12 mode is extremely weak. Interestingly, the red shift of the spectral position of A12 mode correlates with a decrease of the contact potential difference in Kelvin probe force microscopy (KPFM) images. While the TERS maps mostly show the Raman spectra characteristic to the high quality SeMoS Janus monolayers, we observed in some cases narrow, below 20-30 nm, areas that featured a peak at 406 cm-1 which has been proved to be the A’ band of MoS2. The ability to detect the nanoscale imperfections in Janus monolayer crystals is a mandatory condition for optimizing their synthetic routes. TERS imaging cross-correlated with KPFM measurements demonstrate the applicability for the nanoscale assessment of the structural homogeneity of both the as-grown and transferred SeMoS Janus monolayer crystals.
References
1. Z. Gan, I. Paradisanos, A. Estrada-Real et.al. ADVANCED MATERIALS 2022 34, 2205226
2. Marko M. Petrić, Malte Kremser , Matteo Barbone et.al. PHYSICAL REVIEW B 103, 035414 (2021)
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