Presentation
3 October 2022 Dual excitation beam deflection in nonlinear epsilon-near-zero materials
Author Affiliations +
Abstract
Epsilon-near-zero materials are a rapidly expanding field due to their enhanced light matter interaction. These materials have shown large changes in refractive index on the order of the linear index; however, this is associated with large absorption changes. Here we experimentally and theoretically show a method to mitigate the absorption changes in the film while doubling the refractive index modulation. Using beam deflection, a nonlinear technique to measure χ^((3)), individual excitation processes can be controlled in time and space on a film so the nonlinear refractive index change can double on a sample, while the absorption change can be nullified.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Adam R. Ball, Ray Secondo, Dhruv Fomra, Vitaly Avrutin, Umit Ozgur, and Nathaniel Kinsey "Dual excitation beam deflection in nonlinear epsilon-near-zero materials", Proc. SPIE PC12228, Ultrafast Nonlinear Imaging and Spectroscopy X, PC122280J (3 October 2022); https://doi.org/10.1117/12.2632849
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KEYWORDS
Absorption

Refractive index

Modulation

Plasma

Electrons

Nonlinear optics

Nonlinear response

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