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4 October 2022 Weak stripe angle determination by quantitative x-ray magnetic microscopy (Conference Presentation)
Daniel Lacour, K. Ait Oukaci, D. Stoeffler, B. Sarpi, F. Montaigne, R. Belkhou, M. Hehn
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Proceedings Volume PC12205, Spintronics XV; PC122051B (2022) https://doi.org/10.1117/12.2634545
Event: SPIE Nanoscience + Engineering, 2022, San Diego, California, United States
Abstract
High-resolution scanning transmission X-ray microscopy (STXM) can provide quantitative access to the tilt angles of the local magnetization with respect to the surface. We use this state-of-the-art microscopy technique to probe the magnetic texture of the weak stripes texture hosted by a 180 nm thick Co40Fe40B20 layer. We report a comprehensive set of measurements of the weak stripes texture tilt angle, as well as a method that uses only a single direction x-ray beam to extract the angle. This method also extracts the spatial profile with 30 nm resolution and measures the tilt angle as a function of the applied field. Combining these informations, the macroscopic loop of magnetization as a function of applied field on a complex spin texture can be reconstructed in an unprecedented way and shows without doubt that flux closure domains exist. Beyond the characterization of the weak stripe angle, this quantitative magnetic X-ray microscopy technique can be used to study the local textures present in all materials exhibiting some circular magnetic X-ray dichroism.
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Daniel Lacour, K. Ait Oukaci, D. Stoeffler, B. Sarpi, F. Montaigne, R. Belkhou, and M. Hehn "Weak stripe angle determination by quantitative x-ray magnetic microscopy (Conference Presentation)", Proc. SPIE PC12205, Spintronics XV, PC122051B (4 October 2022); https://doi.org/10.1117/12.2634545
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KEYWORDS
X-ray microscopy
Magnetism
X-rays
Microscopy
Dichroic materials
Spatial resolution
X-ray characterization
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