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We investigate the effect of surface oxide contamination on the terahertz (THz) emission via the inverse spin Hall effect from spintronic Fe/Pt bilayers pumped using femtosecond laser pulses. The metallic films were grown on Si and quartz substrates, both with and without a 300 nm Al2O3 spacer layer. The presence of the Al2O3 layer between the substrate and the metallic films results in a 350% increase in the measured THz electric field in the case of Si substrates, while an increase of 10% is observed when using quartz substrates. X-ray photoelectron spectroscopy (XPS) is used to gain insight into the elemental composition of the emitters, and the presence and intensity of iron oxide peaks explains the difference in the emitted THz signals.
Basem Y. Shahriar andAbdulhakem Y. Elezzabi
"Characterisation of the influence of substrate oxidation on spintronic terahertz emitters", Proc. SPIE PC12000, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XV, PC1200009 (7 March 2022); https://doi.org/10.1117/12.2611545
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Basem Y. Shahriar, Abdulhakem Y. Elezzabi, "Characterisation of the influence of substrate oxidation on spintronic terahertz emitters," Proc. SPIE PC12000, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XV, PC1200009 (7 March 2022); https://doi.org/10.1117/12.2611545