Paper
30 September 2016 Multi-station electron scrubbing and performance testing device of large-area MCP
Yun-sheng Qian, LiMing Tang, ChengXin Song, Jian Liu, Cheng Feng, Yijun Zhang
Author Affiliations +
Abstract
Microchannel Plates(MCP) have been widely used in X-ray detection, night vision and other fields. X-ray detection used in the field of space usually requires a lot of large area of MCPs. A set of multi-station electron scrubbing and performance testing device for large area MCP is developed in this paper. Four sets of large area electron source are designed for electron scrubbing. Aiming at single MCP and dual-MCP structure, the high voltage power system, signal processing module and mechanical control structure are designed to achieve scrubbing and testing of 4 groups of large area MCP at the same time. By using this device, the scrubbing and testing of large area MCPs of 106mm in diameter are achieved. The test results are given and analyzed.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yun-sheng Qian, LiMing Tang, ChengXin Song, Jian Liu, Cheng Feng, and Yijun Zhang "Multi-station electron scrubbing and performance testing device of large-area MCP", Proc. SPIE 9968, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII, 99680K (30 September 2016); https://doi.org/10.1117/12.2238501
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Microchannel plates

X-ray detectors

Power supplies

Gold

X-rays

Computing systems

Signal processing

RELATED CONTENT

Research on SNR testing technology of EBCMOS
Proceedings of SPIE (April 17 2020)
Redline multiple-array controller for SpeX
Proceedings of SPIE (August 21 1998)
Multimode Radar Processor
Proceedings of SPIE (December 08 1978)
A study on a micro stepping drive system for space...
Proceedings of SPIE (August 15 2011)
A new gated x ray detector for the Orion laser...
Proceedings of SPIE (October 19 2012)
Multi-channel amplitude analyzer for x-ray investigations
Proceedings of SPIE (December 06 2006)

Back to Top