An evaluation methodology for long-range jammer to CCD

Wen-pan Zhang; Guang-sen Ren; Yan-bin Wang; Hua Li; Rong-zhen Zhu

doi:10.1117/12.2219995

5 November 2015 An evaluation methodology for long-range jammer to CCD

Wen-pan Zhang, Guang-sen Ren, Yan-bin Wang, Hua Li, Rong-zhen Zhu

Proceedings Volume 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015; 97952W (2015) https://doi.org/10.1117/12.2219995
Event: Selected Proceedings of the Photoelectronic Technology Committee Conferences held June-July 2015, 2015, Hefei, Suzhou, and Harbin, China

Abstract

By analyzing the factors of laser transmission from long-range jammer to CCD in the distribution of laser at the entrance of optical system of CCD, an evaluation methodology was established which utilized the ATP error data and the distribution of laser through turbulent atmosphere together and could get the jamming probability which could be used to get evaluation result. A conversion method was devised to convert test data to simulation data of ATP. Based on circular aperture Fraunhofer diffraction theory, a simplified model that only used the central bright patch was provided to convert the relationship between the number of saturated pixel and the incident laser energy by testing to the relationship in simulation. Some advice was given for the usage of test data of ATP and the relationship between the number of saturated pixel and the incident laser energy by testing to make sure that the data is available.

Citation Download Citation

Wen-pan Zhang, Guang-sen Ren, Yan-bin Wang, Hua Li, and Rong-zhen Zhu "An evaluation methodology for long-range jammer to CCD", Proc. SPIE 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015, 97952W (5 November 2015); https://doi.org/10.1117/12.2219995

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