Spatially resolved spectroscopy using swept-source optical interferometry

Ryoma Onita; Tatsutoshi Shioda

doi:10.1117/12.2212228

15 March 2016 Spatially resolved spectroscopy using swept-source optical interferometry

Ryoma Onita, Tatsutoshi Shioda

Proceedings Volume 9754, Photonic Instrumentation Engineering III; 975407 (2016) https://doi.org/10.1117/12.2212228
Event: SPIE OPTO, 2016, San Francisco, California, United States

Abstract

We describe principle of spatially-resolved spectroscopy using swept source optical interferometry and demonstrate it using a multi-layered polypropylene and glass plates piled sample. The advantages of this technique compared to conventional spectroscopy technique are realizing spatially-resolved spectroscopy as transmittance spectra of each layer and obtaining tomographic image of the sample simultaneously. Moreover, potential for spectroscopy is the method we propose can calculate absorption coefficient of each mediums. In this demonstration, we could 1D tomographic image of multi-layered sample and characterize PP layer and glass layer by comparing transmittance spectra in near infrared region.

Citation Download Citation

Ryoma Onita and Tatsutoshi Shioda "Spatially resolved spectroscopy using swept-source optical interferometry", Proc. SPIE 9754, Photonic Instrumentation Engineering III, 975407 (15 March 2016); https://doi.org/10.1117/12.2212228

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