Hot Spot Detection Probability Dependence On Thermal Imager Parameters

U. Agam; E. Gal; N. Markevich; E. Grimberg

doi:10.1117/12.948300

7 December 1988 Hot Spot Detection Probability Dependence On Thermal Imager Parameters

U. Agam, E. Gal, N. Markevich, E. Grimberg

Proceedings Volume 0972, Infrared Technology XIV; (1988) https://doi.org/10.1117/12.948300
Event: 32nd Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1988, San Diego, CA, United States

Abstract

The probability of detecting (Pr) a target in a thermal image is an important performance parameter in many ima'6ing systems. The system P depends on many parameters, such as: noise equivalent temperature difference (NETD), instantaneous field of view (IFOV), background characteristics and scanning efficiency. In this presentation the theoretical dependence of Pc on some of the above-mentioned parameters is discussed. Laboratory simulation results as well as some field test results are shown in this paper. 1.

Citation Download Citation

U. Agam, E. Gal, N. Markevich, and E. Grimberg "Hot Spot Detection Probability Dependence On Thermal Imager Parameters", Proc. SPIE 0972, Infrared Technology XIV, (7 December 1988); https://doi.org/10.1117/12.948300

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