Paper
9 March 2016 Study of in-homogeneities in PMMA samples using a 3D-SD-OCT system
Author Affiliations +
Proceedings Volume 9718, Quantitative Phase Imaging II; 97181T (2016) https://doi.org/10.1117/12.2217269
Event: SPIE BiOS, 2016, San Francisco, California, United States
Abstract
Industrial applications of embedded materials have been increased in the recent years as the study of their mechanical properties. A particular interest is their homogeneousness which will determine a significant improvement or decay in the possible application. The optical system proposed here can show the internal micro structure and the internal displacements along a scanned volume through consecutives 2D tomographic and optical phase images. The volumetric information is retrieved by means of a liner stage which avoids the use of expensive tilting devices. Results show the response of homogeneous and in-homogeneous PMMA samples during controlled tests in order to find the simplest one which determines the sample’s condition.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Manuel de Jesús Briones R., Manuel H. De la Torre-I., Jorge M. Flores-M., Cesar G. Tavera, Juan M. Luna H., and Fernando Mendoza S. "Study of in-homogeneities in PMMA samples using a 3D-SD-OCT system", Proc. SPIE 9718, Quantitative Phase Imaging II, 97181T (9 March 2016); https://doi.org/10.1117/12.2217269
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KEYWORDS
Particles

Polymethylmethacrylate

Silica

Tomography

Optical coherence tomography

Inspection

Copper

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