Accurate time delay technology in simulated test for high precision laser range finder

Zhibin Chen; Wenjian Xiao; Weiming Wang; Mingxi Xue

doi:10.1117/12.2199041

8 October 2015 Accurate time delay technology in simulated test for high precision laser range finder

Zhibin Chen, Wenjian Xiao, Weiming Wang, Mingxi Xue

Proceedings Volume 9677, AOPC 2015: Optical Test, Measurement, and Equipment; 96770Q (2015) https://doi.org/10.1117/12.2199041
Event: Applied Optics and Photonics China (AOPC2015), 2015, Beijing, China

Abstract

With the continuous development of technology, the ranging accuracy of pulsed laser range finder (LRF) is higher and higher, so the maintenance demand of LRF is also rising. According to the dominant ideology of "time analog spatial distance" in simulated test for pulsed range finder, the key of distance simulation precision lies in the adjustable time delay. By analyzing and comparing the advantages and disadvantages of fiber and circuit delay, a method was proposed to improve the accuracy of the circuit delay without increasing the count frequency of the circuit. A high precision controllable delay circuit was designed by combining the internal delay circuit and external delay circuit which could compensate the delay error in real time. And then the circuit delay accuracy could be increased. The accuracy of the novel circuit delay methods proposed in this paper was actually measured by a high sampling rate oscilloscope actual measurement. The measurement result shows that the accuracy of the distance simulated by the circuit delay is increased from ± 0.75m up to ± 0.15m. The accuracy of the simulated distance is greatly improved in simulated test for high precision pulsed range finder.

Citation Download Citation

Zhibin Chen, Wenjian Xiao, Weiming Wang, and Mingxi Xue "Accurate time delay technology in simulated test for high precision laser range finder", Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 96770Q (8 October 2015); https://doi.org/10.1117/12.2199041

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