Comparison Of Wavelength Scaling Data To Experiment

John C. Stover; Jeff Rifkin; Daniel R. Cheever; Kelly H. Kirchner; Tod F. Schiff

doi:10.1117/12.948089

5 April 1989 Comparison Of Wavelength Scaling Data To Experiment

John C. Stover, Jeff Rifkin, Daniel R. Cheever, Kelly H. Kirchner, Tod F. Schiff

Proceedings Volume 0967, Stray Light and Contamination in Optical Systems; (1989) https://doi.org/10.1117/12.948089
Event: 32nd Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1988, San Diego, CA, United States

Abstract

Wavelength scaling is the process of using scatter data at one wavelength to predict scatter at a different wavelength from the same optical component. The economic advantages of avoiding scatter measurements at all wavelengths of interest are obvious; however, the subtleties involved in making accurate wavelength scaling predictions are not. The requirements of the vector perturbation theory that the optic be a clean, smooth, front surface reflector are not always easily met for all desired wavelengths and materials. Furthermore, the experiments themselves are not trivial because they often involve all the complexities of instrument comparison measurements. This paper presents data for one dimensional (grating like) and two dimensional (polished) reflectors at wavelengths of 1.06, .86, .63, and .49 microns. The results show excellent correlation for both cases.

Citation Download Citation

John C. Stover, Jeff Rifkin, Daniel R. Cheever, Kelly H. Kirchner, and Tod F. Schiff "Comparison Of Wavelength Scaling Data To Experiment", Proc. SPIE 0967, Stray Light and Contamination in Optical Systems, (5 April 1989); https://doi.org/10.1117/12.948089

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